| 0 | -- | 0 | Hugo De Man. Submicron design tools: problems and suppliers |
| 2 | -- | 0 | Kenneth D. Wagner, Yervant Zorian. EIC Message |
| 3 | -- | 0 | Vishwani D. Agrawal. 1995 Asian Test Symposium carves a niche |
| 5 | -- | 0 | Ajit M. Prabhu, Richard L. Campbell. Management Perspectives in EDA |
| 8 | -- | 9 | Bozena Kaminska, Bernard Courtois. Guest Editors Introduction: Mixed Analog and Digital Systems |
| 10 | -- | 17 | Thomas Olbrich, Andrew M. D. Richardson. Design and Self-Test for Switched-Current Building Blocks |
| 18 | -- | 25 | Ashok Balivada, Jin Chen, Jacob A. Abraham. Analog Testing with Time Response Parameters |
| 26 | -- | 33 | Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi. DC Built-In Self-Test for Linear Analog Circuits |
| 34 | -- | 41 | Yukiya Miura. Real-Time Current Testing for A/D Converters |
| 42 | -- | 57 | Stephen Dean Brown, Jonathan Rose. FPGA and CPLD Architectures: A Tutorial |
| 58 | -- | 70 | Raul San Martin, John P. Knight. Optimizing Power in ASIC Behavioral Synthesis |
| 72 | -- | 82 | Paul E. Landman, Renu Mehra, Jan M. Rabaey. An Integrated CAD Environment for Low-Power Design |
| 83 | -- | 89 | . A D&T Roundtable Deep-Submicron Design |
| 93 | -- | 0 | . Design Automation Technical Committee Newsletter |
| 94 | -- | 95 | . Test Technology Tc Newsletter |
| 96 | -- | 0 | Scott Davidson. A test puzzle for a TGIF morning |