Journal: IEEE Design & Test of Computers

Volume 16, Issue 1

1 -- 0Yervant Zorian. Focus on DRAMs
3 -- 4. News
5 -- 0. Conference Reports
6 -- 0. Panel Summaries
9 -- 15. Dado Banatao: Profile of a Silicon Valley Entrepreneur
16 -- 18Robin Saxby, Peter Harrod. Test in the Emerging Intellectual Property Business
19 -- 21Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer. Guest Editors Introduction: DRAM Architecture and Testing
22 -- 31Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott. Fault Models and Tests for a 2-Bit-per-Cell MLDRAM
32 -- 41Duncan G. Elliott, Michael Stumm, W. Martin Snelgrove, Christian Cojocaru, Robert McKenzie. Computational RAM: Implementing Processors in Memory
42 -- 52Bruce Millar, Peter Gillingham. Two High-Bandwidth Memory Bus Structures
53 -- 58Shinji Miyano, Katsuhiko Sato, Kenji Numata. Universal Test Interface for Embedded-DRAM Testing
59 -- 70Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang. A Programmable BIST Core for Embedded DRAM
71 -- 79Kenneth M. Butler. Estimating the Economic Benefits of DFT
88 -- 89Mukund Modi. P1532, WAVES, and a New Initiative
96 -- 0Al Crouch. The DFT Psychic Network