| 1 | -- | 0 | Yervant Zorian. Integration Continues |
| 5 | -- | 6 | . News |
| 6 | -- | 0 | . Letter to the Editor |
| 7 | -- | 13 | Terry Thomas. Technology for IP Reuse and Portability |
| 14 | -- | 15 | Charles F. Hawkins, Jerry M. Soden. Deep Submicron CMOS Current IC Testing: Is There a Future? |
| 16 | -- | 17 | Bernard Courtois, R. D. (Shawn) Blanton. Guest Editors Introduction |
| 18 | -- | 27 | Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton. Hierarchical Design and Test of Integrated Microsystems |
| 28 | -- | 38 | Salvador Mir, Benoît Charlot. On the Integration of Design and Test for Chips Embedding MEMS |
| 39 | -- | 47 | Nicholas R. Swart. A Design Flow for Micromachined Electromechanical Systems |
| 48 | -- | 56 | Alain Béliveau, Guy T. Spencer, Keith A. Thomas, Scott L. Roberson. Evaluation of MEMS Capacitive Accelerometers |
| 58 | -- | 65 | Edward K. Chan, Krishna Garikipati, Robert W. Dutton. Comprehensive Static Characterization of Vertical Electrostatically Actuated Polysilicon Beams |
| 66 | -- | 73 | Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin. Test and Reliability: Partners in IC Manufacturing, Part 2 |
| 74 | -- | 83 | Peter J. Ashenden, Philip A. Wilsey. Protected Shared Variables in VHDL: IEEE Standard 1076a |
| 84 | -- | 88 | Ralph Mason, Shing Ma. Analog DFT Using an Undersampling Technique |
| 90 | -- | 95 | . A D&T Roundtable: Design Automation in Europe |
| 96 | -- | 99 | Dilip K. Bhavsar. ITC 99 Panels |
| 100 | -- | 101 | . Conference Reports |
| 102 | -- | 108 | . IEEE Design & Test of Computers 1999 Annual Index, Volume 16 |
| 109 | -- | 0 | . DATC Newsletter |
| 110 | -- | 111 | . TTTC Newsletter |
| 112 | -- | 0 | Chris Rowen. Sailing on a Sea of Processors |