| 269 | -- | 270 | . From the EIC: Manufacturing test woes |
| 274 | -- | 276 | André Ivanov, Fabrizio Lombardi, Cecilia Metra. Guest Editors Introduction: Advances in VLSI Testing at MultiGbps Rates |
| 278 | -- | 286 | T. M. Mak, Mike Tripp, Anne Meixner. Testing Gbps Interfaces without a Gigahertz Tester |
| 288 | -- | 301 | David C. Keezer, Dany Minier, Marie-Christine Caron. Multiplexing ATE Channels for Production Testing at 2.5 Gbps |
| 302 | -- | 313 | Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov. Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects |
| 314 | -- | 321 | Stephen K. Sunter, Aubin Roy. On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz |
| 322 | -- | 330 | Ming-Jun Hsiao, Jing-Reng Huang, Tsin-Yuan Chang. A Built-In Parametric Timing Measurement Unit |
| 331 | -- | 338 | Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian. Design & Test Education in Asia |
| 339 | -- | 341 | . Conference Reports |
| 342 | -- | 0 | . Panel Summaries |
| 343 | -- | 0 | John Willis, Joe Damore. Design automation Technical Committee Newsletter |
| 344 | -- | 0 | Rob Aitken. Test at Gbps: Megaproblem or micromanagement? |