Journal: IEEE Design & Test of Computers

Volume 23, Issue 5

333 -- 0Kwang-Ting (Tim) Cheng. The New World of ESL Design
335 -- 337Sandeep K. Shukla, Carl Pixley, Gary Smith. Guest Editors Introduction: The True State of the Art of ESL Design
338 -- 347Patrick Schaumont, Ingrid Verbauwhede. A Component-Based Design Environment for ESL Design
348 -- 358Ivan Radojevic, Zoran A. Salcic, Partha S. Roop. Modeling Embedded Systems: From SystemC and Esterel to DFCharts
359 -- 374Douglas Densmore, Roberto Passerone. A Platform-Based Taxonomy for ESL Design
375 -- 386Stephen A. Edwards. The Challenges of Synthesizing Hardware from C-Like Languages
387 -- 0John Sanguinetti. A Different View: Hardware Synthesis from SystemC is a Maturing Technology
388 -- 389Kenneth M. Butler. Guest Editor s Introduction: ITC Helps Get More Out of Test
390 -- 400Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer. Extracting Defect Density and Size Distributions from Product ICs
402 -- 412Nisar Ahmed, Mohammad Tehranipoor. Improving Transition Delay Test Using a Hybrid Method
414 -- 424Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura. Impact of Thermal Gradients on Clock Skew and Testing
425 -- 0Bruce C. Kim. Test Technology TC Newsletter
426 -- 427Scott Davidson. Book Reviews: A Comprehensive EDA Handbook
428 -- 429Victor Berman. Standards: DASC sees moves toward formality in design
430 -- 431. CEDA Currents
432 -- 0Anne E. Gattiker. Getting More out of ITC