Journal: IBM Journal of Research and Development

Volume 41, Issue 1&2

3 -- 6George L.-T. Chiu, Jane M. Shaw. Optical lithography: Introduction
7 -- 20Steven J. Holmes, Peter H. Mitchell, Mark C. Hakey. Manufacturing with DUV lithography
21 -- 38Christopher P. Ausschnitt, Allan C. Thomas, Timothy J. Wiltshire. Advanced DUV photolithography in a pilot lineenvironment
39 -- 48Rama N. Singh, Alan E. Rosenbluth, George L.-T. Chiu, J. S. Wilczynski. High-numerical-aperture optical designs
49 -- 56Mordechai Rothschild, Anthony R. Forte, Roderick R. Kunz, Susan C. Palmateer, Janusz H. C. Sedlacek. Lithography at a wavelength of 193 nm
57 -- 68Timothy A. Brunner. Impact of lens aberrations on optical lithography
69 -- 80Hiroshi Ito. Chemical amplification resists: History and development within IBM
81 -- 94Jane M. Shaw, Jeffrey D. Gelorme, Nancy C. LaBianca, Will E. Conley, Steven J. Holmes. Negative photoresists for optical lithography
95 -- 104Robert D. Allen, Gregory M. Wallraff, Donald C. Hofer, Roderick R. Kunz. Photoresists for 193-nm lithography
105 -- 118David E. Seeger, Douglas C. La Tulipe Jr., Roderick R. Kunz, Cesar M. Garza, Maureen A. Hanratty. Thin-film imaging: Past, present, prognosis
119 -- 130Russell A. Budd, Derek B. Dove, John L. Staples, Ronald M. Martino, Richard A. Ferguson, J. Tracy Weed. Development and application of a new tool for lithographic mask evaluation, the stepper equivalent Aerial Image Measurement System, AIMS
131 -- 142Fuad E. Doany, Thomas Ainsworth, Norman Bobroff, Douglas Goodman, Alan E. Rosenbluth. Large-field scanning laser ablation system
143 -- 150James L. Speidell, Doris P. Pulaski, Rajesh S. Patel. Masks for laser ablation technology: New requirements and challenges
151 -- 158Fuad E. Doany, Chandrasekhar Narayanaswami. Laser release process to obtain freestanding multilayer metal-polyimide circuits
159 -- 170Hans A. Biebuyck, Niels B. Larsen, Emmanuel Delamarche, Bruno Michel. Lithography beyond light: Microcontact printing with monolayer resists
171 -- 184Anshul Gupta. Fast and effective algorithms for graph partitioning and sparse-matrix ordering