Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 21, Issue 9

998 -- 1010Mariagiovanna Sami, Donatella Sciuto, Cristina Silvano, Vittorio Zaccaria. An instruction-level energy model for embedded VLIW architectures
1011 -- 1024Piet Vanassche, Georges G. E. Gielen, Willy M. C. Sansen. Symbolic modeling of periodically time-varying systems usingharmonic transfer matrices
1025 -- 1036Jiang Hu, Sachin S. Sapatnekar. A timing-constrained simultaneous global routing algorithm
1037 -- 1050Tat Kee Tan, Anand Raghunathan, Ganesh Lakshminarayana, Niraj K. Jha. High-level energy macromodeling of embedded software
1051 -- 1067Eui-Young Chung, Luca Benini, Giovanni De Micheli, Gabriele Luculli, Marco Carilli. Value-sensitive automatic code specialization for embedded software
1068 -- 1076Irith Pomeranz. On the use of random limited-scan to improve at-speed randompattern testing of scan circuits
1077 -- 1087Kaijie Wu, Ramesh Karri. Algorithm level recomputing using allocation diversity: a registertransfer level approach to time redundancy-based concurrent errordetection
1088 -- 1094Vikram Iyengar, Krishnendu Chakrabarty. System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints
1095 -- 1101Dimitrios Kagaris, Spyros Tragoudas. On the nonenumerative path delay fault simulation problem
1101 -- 1104Mutsumi Kimura, Satoshi Inoue, Tatsuya Shimoda. Table look-up model of thin-film transistors for circuit simulationusing spline interpolation with transformation by y=x+log(x)
1105 -- 1113Dong Xiang, Hideo Fujiwara. Handling the pin overhead problem of DFTs for high-quality and at-speed tests