Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 3, Issue 4

257 -- 264Teofilo F. Gonzalez. An Approximation Problem for the Multi-Via Assignment Problem
264 -- 278Rob A. Rutenbar, Trevor N. Mudge, Daniel E. Atkins. A Class of Cellular Architectures to Support Physical Design Automation
279 -- 287Dale E. Hocevar, Michael R. Lightner, Timothy N. Trick. An Extrapolated Yield Approximation Technique for Use in Yield Maximization
288 -- 297James R. Armstrong. Chip Level Modeling of LSI Devices
298 -- 307Jeong-Tyng Li, Malgorzata Marek-Sadowska. Global Routing for Gate Array
308 -- 331A. Richard Newton, Alberto L. Sangiovanni-Vincentelli. Relaxation-Based Electrical Simulation
331 -- 349Tzu-Mu Lin, Carver Mead. Signal Delay in General RC Networks

Volume 3, Issue 3

165 -- 171V. Visvanathan, Alberto L. Sangiovanni-Vincentelli. A Computational Approach for the Diagnosability of Dynamical Circuits
172 -- 177Takeshi Tokuda, Jiro Korematsu, Osamu Tomisawa, S. Asai, I. Ohkura, T. Enomoto. A Hierarchical Standard Cell Approach for Custom VLSI Design
178 -- 183Tom Tsan-Kuo Tarng, Malgorzata Marek-Sadowska, Ernest S. Kuh. An Efficient Single-Row Routing Algorithm
184 -- 190Malgorzata Marek-Sadowska. An Unconstrained Topological Via Minimization Problem for Two-Layer Routing
191 -- 199J. R. Egan, C. L. Liu. Bipartite Folding and Partitioning of a PLA
200 -- 208John P. Hayes. Fault Modeling for Digital MOS Integrated Circuits
208 -- 217F. J. Hill, Zainalabedin Navabi, C. H. Chiang, Duan-Ping Chen, M. Masud. Hardware Compilation from an RTL to a Storage Logic Array Target
218 -- 225Chung-Kuan Cheng, Ernest S. Kuh. Module Placement Based on Resistive Network Optimization
226 -- 234Ronald A. Rohrer, Hassan Nosrati, Kenneth W. Heizer. Quasi-Static Control of Explicit Algorithms for Transient Analysis
235 -- 241Sangyong Han, Sartaj Sahni. Single-Row Routing in Narrow Streets
242 -- 249John K. Ousterhout. The User Interface and Implementation of an IC Layout Editor
250 -- 255H. N. Brady. An Approach to Topological Pin Assignment
256 -- 256Giovanni De Micheli, Alberto L. Sangiovanni-Vincentelli. Correction to Multiple Constrained Folding of Programmable Logic Arrays: Theory and Applications

Volume 3, Issue 2

117 -- 122Claudio Turchetti, Guido Masetti. A CAD-Oriented Analytical MOSFET Model for High-Accuracy Applications
123 -- 126Sharad C. Seth, Vishwani D. Agrawal. Characterizing the LSI Yield Equation from Wafer Test Data
126 -- 134Thomas A. Johnson, Ronald W. Knepper, Victor Marcello, Wen Wang. Chip Substrate Resistance Modeling Technique for Integrated Circuit Design
135 -- 141E. Barke. A Network Comparison Algorithm for Layout Verification of Integrated Circuits
142 -- 149Fabio Somenzi, Silvano Gai, Marco Mezzalama, Paolo Prinetto. PART: Programmable Array Testing Based on a Partitioning Algorithm
150 -- 155David J. Lu, Edward J. McCluskey. Quantitative Evaluation of Self-Checking Circuits
156 -- 163Yun Kang Chen, Mei Lun Liu. Three-Layer Channel Routing

Volume 3, Issue 1

1 -- 2Constantine N. Anagnostopoulos, Savvas G. Chamberlain. Foreword
3 -- 11Edward M. Reingold, Kenneth J. Supowit. A Hierarchy-Driven Amalgamation of Standard and Macro Cells
12 -- 20Gershon Kedem, Hiroyuki Watanabe. Graph-Optimization Techniques for IC Layout and Compaction
20 -- 26David C. Smith, Richard Noto, Fred Borgini, Shanti S. Sharma, Joseph C. Werbickas. The Variable Geometry Automated Universal Array Layout System (VGAUA)
27 -- 40P. I. Jennings, S. L. Hurst, A. McDonald. A Highly Routable ULM Gate Array and Its Automated Customizaton
40 -- 46Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director. FABRICS II: A Statistically Based IC Fabrication Process Simulator
47 -- 51O. Melstrand, Eamonn O Neill, Gerald E. Sobelman, D. Dokos. A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
52 -- 64Siegfried Selberherr, Christian A. Ringhofer. Implications of Analytical Investigations About the Semiconductor Equations on Device Modeling Programs
64 -- 71A. M. Mazzone, G. Rocca. Three-Dimensional Monte Carlo Simulations--Part I: Implanted Profiles for Dopants in Submicron Device
72 -- 79Yannis P. Tsividis, Guido Masetti. Problems in Precision Modeling of the MOS Transistor for Analog Applications
80 -- 87Dileep A. Divekar, Richard I. Dowell. A Depletion-Mode MOSFET Model for Circuit Simulation
87 -- 100John K. Ousterhout. Corner Stitching: A Data-Structuring Technique for VLSI Layout Tools
101 -- 103Dileep A. Divekar. DC Statistical Circuit Analysis for Bipolar IC s Using Parameter Correlations-An Experimental Example
104 -- 111A. L. Silburt, R. C. Foss, W. F. Petrie. An Efficient MOS Transistor Model for Computer-Aided Design