Journal: IEEE T. Instrumentation and Measurement

Volume 56, Issue 2

212 -- 213Andrea De Marchi. EditorialForeword
214 -- 215Giancarlo Marullo-Reedtz. Guest Editorial: CPEM 2006
216 -- 220Pasquale Arpaia, Alessandro Masi, Giovanni Spiezia. Digital Integrator for Fast Accurate Measurement of Magnetic Flux by Rotating Coils
221 -- 225Hiroyuki Fujimoto, Giovanni Mana, Kan Nakayama. A Universal Geometry for Calculable Frequency-Response Coefficient of LCR Standards and New 10-MHz Resistance and 1.6-MHz Quadrature-Bridge Systems
226 -- 229Geoffrey P. Barwood, Patrick Gill, Guilong Huang, Hugh A. Klein. Observation of a Sub-10-Hz Linewidth :::88:::Sr:::+ 2:::S::1/2::-:::2:::D::5/2:: Clock Transition at 674 nm
230 -- 234Ling Hao, John C. Macfarlane, John C. Gallop, David Cox, P. Joseph-Franks, D. Hutson, J. Chen, S. K. H. Lam. Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter
235 -- 238Ralf Behr, Luis Palafox, Günther Ramm, Harald Moser, J. Melcher. Direct Comparison of Josephson Waveforms Using an AC Quantum Voltmeter
239 -- 243Mikko Merimaa, Kaj Nyholm, M. Vainio, Antti Lassila. An AC Josephson Voltage Standard for AC-DC Transfer-Standard Measurements
249 -- 252Marco Berutto, Massimo Ortolano, Alberto Mura, Felice Periale, Andrea De Marchi. Toward the Determination of G With a Simple Pendulum
253 -- 256Marco Berutto, Giovanni A. Costanzo, Andrea De Marchi. A Novel Technique for Blackbody Shift Evaluation in Cs With a Fountain Standard
257 -- 261Horst Bettin, Hans Toth. Density Determination of a Small Isotopically Enriched Silicon Single Crystal
262 -- 265Niccolò Beverini, Giorgio Carelli, Andrea De Michele, Augusto Moretti, Lukas Mahler, Alessandro Tredicucci, Harvey Beere, David Ritchie. Frequency Characterization of a Terahertz Quantum-Cascade Laser
266 -- 270Mark Bieler, Steffen Seitz 0002, Meinhard Spitzer, Günter Hein, Klaus Pierz, Uwe Siegner, M. A. Basu, Andrew J. A. Smith, Matthew R. Harper. Rise-Time Calibration of 50-GHz Sampling Oscilloscopes: Intercomparison Between PTB and NPL
271 -- 274Michele Borsero, Giuseppe Vizio, Daniela Parena, Valeria Teppati. Synthetic TDR Measurements for TEM and GTEM Cell Characterization
275 -- 279Giorgio Brida, Maria Chekhova, Marco Genovese, Alexander Penin, Maria Luisa Rastello, Ivano Ruo-Berchera. Absolute Calibration of Analog Detectors by Using Parametric Down Conversion
280 -- 283Richard J. C. Brown, Martin J. T. Milton. Stripping Voltammetry as a Possible Primary Method for Amount of Substance
284 -- 288Ilya Budovsky. Measurement of Phase Angle Errors of Precision Current Shunts in the Frequency Range From 40 Hz to 200 kHz
289 -- 294Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr. Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards
295 -- 299Luca Callegaro, Vincenzo D Elia, Pier Paolo Capra, Andrea Sosso. Techniques for Traceable Measurements of Small Currents
300 -- 304Mario Chiampi, Gabriella Crotti, Domenico Giordano. Set Up and Characterization of a System for the Generation of Reference Magnetic Fields From 1 to 100 kHz
305 -- 308P. M. Chu, David D. Nelson, Mark S. Zahniser, J. Barry McManus, Quan Shi, J. C. Travis. Towards Realization of Reactive Gas Amount of Substance Standards Through Spectroscopic Measurements
313 -- 315Erik F. Dierikx. A MEMS-Stabilized AC Voltage Reference Source
316 -- 320Lucas Di Lillo, Vivian Grunhut, Fernando Kornblit, Héctor Laiz. Optimization of an AC-DC Transfer Step-Up Scheme
321 -- 325Francesca Durbiano, Alessandra Manzin, Pier Paolo Capra, Oriano Bottauscio, Danilo Serazio. An Electrode-Matrix Cell for Electrolytic Conductivity Measurements
326 -- 330Nick E. Fletcher, Stephen P. Giblin, Jonathan M. Williams, K. J. Lines. New Capability for Generating and Measuring Small DC Currents at NPL
331 -- 335Jeff L. Flowers, P. E. G. Baird, L. Bougueroua, Helen Altman Klein, H. S. Margolis. The NPL Rydberg Constant Experiment
336 -- 340Mathilde Fouché, Rodolphe Le Targat, Xavier Baillard, Anders Brusch, Olivier Tcherbakoff, Giovanni D. Rovera, Pierre Lemonde. Accuracy Evaluation of a :::87:::Sr Optical Lattice Clock
341 -- 345George M. Free, Thomas E. Lipe, Joseph R. Kinard, June E. Sims. Characterization of RF-DC Transfer Difference for Thermal Voltage Converters With Built-in Tees in the Frequency Range 1 MHz to 1 GHz
346 -- 350Miho Fujieda, Masanori Aida, Hideo Maeno, Lam Quoc Tung, Jun Amagai. Delay Difference Calibration of TWSTFT Earth Station Using Multichannel Modem
351 -- 355Hiroyuki Fujimoto, Giovanni Mana, Kan Nakayama. A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter
356 -- 360Daiji Fukuda, Nobuyuki Zen, Masataka Ohkubo, Hiroyuki Takahashi, K. Amemiya, M. Endo. Improvements in the AIST Cryogenic Radiometer With Superconducting Thermometer
361 -- 364Torsten Funck, Manfred Klonz. Improved AC-DC Current Transfer Step-Up With New Current Shunts and Potential Driven Guarding
365 -- 368Gianluca Galzerano, Paolo Laporta. Absolute Frequency Stabilization of Diode Lasers Around 0.94 μm
369 -- 372D. Georgakopoulos, P. S. Wright. Exercising the Dynamic Range of Active Power Meters Under Nonsinusoidal Conditions
373 -- 377Stephen P. Giblin, Jonathan M. Williams. Automation of a Coaxial Bridge for Calibration of AC Resistors
378 -- 382Aldo Godone, Filippo Levi, Salvatore Micalizio, E. K. Bertacco, Claudio E. Calosso. Frequency-Stability Performances of the Pulsed Optically Pumped Rubidium Clock: Recent Results and Future Perspectives
383 -- 387Stéphane Guérandel, Thomas Zanon, N. Castagna, F. Dahes, Emeric de Clercq, Noël Dimarcq, André Clairon. Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock
388 -- 391Jari K. Hällström, Martti M. Aro, A. Bergman, V. Bovier-Lapierre, F. Garnacho, J. I. Juvik, V. Kiseliev, Z. Lian Hong, Wolfgang Lucas, Yi Li, M. L. Pykälä, Juris Rungis, K. Schon, V. H. Truong. Worldwide Comparison of Lightning Impulse Voltage Measuring Systems at the 400-kV Level
392 -- 396Ling Hao, John C. Macfarlane, John C. Gallop, David Cox, P. Joseph-Franks, D. Hutson, J. Chen, S. K. H. Lam. Novel Methods of Fabrication and Metrology of Superconducting NanoStructures
397 -- 400Masanobu Hirose, Satoru Kurokawa, Koji Komiyama. Antenna Measurements by One-Path Two-Port Calibration Using Radio-on-Fiber Extended Port Without Power Supply
401 -- 405Masahiro Horibe, Masaaki Shida, Koji Komiyama. S-Parameters of Standard Airlines Whose Connector Is Tightened With Specified Torque
406 -- 409Ernest Houtzager, Gert Rietveld. Automated Low-Ohmic Resistance Measurements at the μΩ/Ω Level
410 -- 413Waldemar G. Kürten Ihlenfeld, Enrico Mohns, Kristian Dauke. Classical Nonquantum AC Power Measurements With Uncertainties Approaching 1 μW/VA
414 -- 417Waldemar G. Kürten Ihlenfeld, Enrico Mohns, M. Serra, Kristian Dauke, A. Suchy. Quasi-Synchronous Microcontroller-Based Highly Accurate Digital Sampling of AC Signals
418 -- 421J. Íñiguez, V. Raposo, P. Hernández. Contactless Technique for Low-Frequency Measurement of Resistivity in Nonmagnetic Conductive Tubes
422 -- 425Masanori Ishii, Koji Komiyama. Impedance Method for a Shielded Standard Loop Antenna
426 -- 430R. Iuzzolino, Waldemar G. Kürten Ihlenfeld. High-Accuracy Methods and Measurement Procedures for Power Quality Parameters Using the Digital Synchronous Sampling Technique
431 -- 434Blaise Jeanneret, Frédéric Overney. Phenomenological Model for Frequency-Related Dissipation in the Quantized Hall Resistance
435 -- 438No-Weon Kang, Jin-Seob Kang, Dae-Chan Kim, Jeong Hwan Kim. Fabrication of Small Reference Probe and Its Application
439 -- 443Tae-Weon Kang, Jeong Hwan Kim, E. F. Yurchuk, Jeong-Il Park, M. V. Sargsyan, I. E. Arsaev, R. I. Ouzdin. Design, Construction, and Performance Evaluation of a Cryogenic 7-mm Coaxial Noise Standard
448 -- 452Eok Bong Kim, Sang-Eon Park, Chang Yong Park, Young-Ho Park, Dae-Su Yee, Taeg Yong Kwon, Ho Seong Lee, Hyuck Cho. Absolute Frequency Measurement of F = 4 → F:::′::: = 5 Transition Line of Cesium Using Amplified Optical Frequency Comb
453 -- 457Han Jun Kim, Rae Duk Lee, Yu. P. Semenov. Resistors With Calculable Frequency Dependencies Up to 1 MHz
458 -- 462Kiwoong Kim, Won-Kyu Lee, In-Seon Kim, Han Seb Moon. Atomic Vector Gradiometer System Using Cesium Vapor Cells for Magnetocardiography: Perspective on Practical Application
463 -- 467Peter Kleinschmidt, Stephen P. Giblin, Vladimir Antonov, Hideomi Hashiba, Leonid Kulik, Alexander Tzalenchuk, Susumu Komiyama. A Highly Sensitive Detector for Radiation in the Terahertz Region
468 -- 471Manfred Klonz, Torsten Funck. Micropotentiometers Providing Low Output Impedance for Millivolt AC-DC Transfer
472 -- 475Johannes Kohlmann, Franz Müller, Oliver F. Kieler, Ralf Behr, Luis Palafox, M. Kahmann, Jürgen Niemeyer. Josephson Series Arrays for Programmable 10-V SINIS Josephson Voltage Standards and for Josephson Arbitrary Waveform Synthesizers Based on SNS Junctions
476 -- 480Naoki Kuramoto, Kenichi Fujii, Yasushi Azuma, Shigeki Mizushima, Yasutake Toyoshima. Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning
481 -- 485John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs. Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz
486 -- 490Ray-Rong Lao, Wen-Lie Liang, Wen-Tron Shay, Richard P. Thompson, Richard A. Dudley, Olivier Merckel, Nicolas Ribiere-Tharaud, Jean-Charles Bolomey, Jenn-Hwan Tarng. High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement
491 -- 494Sergey V. Lotkhov, Vladimir A. Krupenin, Alexander B. Zorin. Cooper Pair Transport in a Resistor-Biased Josephson Junction Array
495 -- 499François-Xavier Malétras, Pierre Gournay, Ian A. Robinson, Gérard Genevès. A Bias Source for Dynamic Voltage Measurements With a Programmable Josephson Junction Array
500 -- 504Mikko Merimaa, Kaj Nyholm, M. Vainio, Antti Lassila. Traceability of Laser Frequency Calibrations at MIKES
505 -- 508Enrico Mohns, Martin Kahmann. Heterodyne Measurement System (HMS) for Determining Phase Angles
509 -- 512Han Seb Moon, Won-Kyu Lee, Ho-Suhng Suh. Absolute-Frequency Measurement of an Acetylene-Stabilized Laser Locked to the P(16) Transition of :::13:::C::2::H::2:: Using an Optical-Frequency Comb
517 -- 522R. Arnold Nicolaus, Ralf D. Geckeler. Improving the Measurement of the Diameter of Si Spheres
523 -- 528Emilia Nunzi, Lorenzo Galleani, Patrizia Tavella, Paolo Carbone. Detection of Anomalies in the Behavior of Atomic Clocks
529 -- 533Gerardo J. Padilla-Víquez, Jorge Koelliker-Delgado, Olav Werhahn, Karl Jousten, Detlef Schiel. 2-R(12) Line Intensity for Laser-Spectroscopy-Based Gas Analysis Near 2 μm
534 -- 537Luis Palafox, Günther Ramm, Ralf Behr, Waldemar G. Kürten Ihlenfeld, Harald Moser. Primary AC Power Standard Based on Programmable Josephson Junction Arrays
538 -- 542Alain Picard, Michael Stock, Hao Fang, Thomas J. Witt, Dominique Reymann. The BIPM Watt Balance
543 -- 546Umberto Pogliano, Gian Carlo Bosco, Marco Lanzillotti. Calibration of a Wideband Transformer for Measurement in the Millivolt Range by Means of AC-AC Transfer
547 -- 550Günther Ramm, Harald Moser, Reinhold Vollmert. Computer-Controlled Inductive Bridge Standards for Calibrating AC Resistance Thermometry Bridges at Low Frequencies
551 -- 554James Randa, David K. Walker. On-Wafer Measurement of Transistor Noise Parameters at NIST
555 -- 558Dominique Reymann, Stéphane Solve. Limits to the Accuracy of 10-V Josephson Standards Revealed by BIPM On-Site Comparisons
559 -- 563Gert Rietveld, Helko E. van den Brom. Vibration Reed Electrometer for Accurate Measurement of Electrical Currents Below 10 pA
567 -- 570Luciana Scarioni, Manfred Klonz, Ernst Kessler. Explanation for the AC-DC Voltage Transfer Differences in Thin-Film Multijunction Thermal Converters on Silicon Chips at High Frequencies
571 -- 575Luciana Scarioni, Manfred Klonz, Torsten Funck, Rolf Judaschke, Ernst Kessler. Quartz Thin-Film Multijunction Thermal Converters With Built-In Tee Connector for 100 MHz
576 -- 580Marco Schubert, Gerd Wende, Torsten May, U. Huebner, Hans-Georg Meyer, Oleg A. Chevtchenko, Helko E. van den Brom, Ernest Houtzager. Pulse-Driven Josephson Junction Arrays for High-Precision AC-Voltage Synthesis of Unipolar and Bipolar Waveforms
581 -- 583Eddy So, Branislav Djokic. A Portable Current-Comparator-Based System for On-Site Calibrations of Low-Power-Factor Wattmeters
584 -- 587Eddy So, David Bennett. Compact Wideband High-Current ( ≥ 1000 A) Multistage Current Transformers for Precise Measurements of Current Harmonics
588 -- 591Stéphane Solve, Régis Chayramy, Dominique Reymann. A New Fully Automated Measurement Chain for Electronic Voltage Standards at 1.018 V
592 -- 596Richard Steiner, Edwin R. Williams, Ruimin Liu, David B. Newell. Uncertainty Improvements of the NIST Electronic Kilogram
597 -- 600Ulrich Stumper. Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method
601 -- 604Christian Tamm, Burghard Lipphardt, Harald Schnatz, Robert Wynands, Stefan Weyers, Tobias Schneider, Ekkehard Peik. :::171:::Yb:::+::: Single-Ion Optical Frequency Standard at 688 THz
605 -- 609Yi-Hua Tang, Clark A. Hamilton, David Deaver, Harold Parks, Barry M. Wood. The Seventh Intercomparison of Josephson Voltage Standards in North America
610 -- 613Valeria Teppati, Andrea Ferrero, Daniela Parena, Umberto Pisani. Accuracy Improvement of Real-Time Load-Pull Measurements
614 -- 618Chiharu Urano, Nobu-hisa Kaneko, Masaaki Maezawa, Taro Itatani, Sucheta Gorwadkar, Hiroshi Saitou, J. Maeda, Shogo Kiryu. Observation of Quantized Voltage Steps Using a Josephson Junction Array Driven by Optoelectronically Generated Pulses
619 -- 623Takayuki Wakimoto, Jari K. Hällström, Yury Chekurov, Masaru Ishii, Wolfgang Lucas, Jukka Piiroinen, Hiroyuki Shimizu. High-Accuracy Comparison of Lightning and Switching Impulse Calibrators
624 -- 627Yicheng Wang, Andrew D. Koffman, Gerald J. FitzPatrick. Dissipation Factors of Fused-Silica Capacitors in the Audio Frequency Range
628 -- 631Atsushi Waseda, Kenichi Fujii. Density Evaluation of Silicon Thermal-Oxide Layers on Silicon Crystals by the Pressure-of-Flotation Method
632 -- 636Ken-ichi Watabe, Hajime Inaba, K. Okumura, Feng-Lei Hong, John G. Hartnett, Clayton R. Locke, Giorgio Santarelli, Shinya Yanagimachi, Kaoru Minoshima, Takeshi Ikegami, Atsushi Onae, Shin-ichi Ohshima, Hirokazu Matsumoto. Optical Frequency Synthesis From a Cryogenic Sapphire Oscillator Using a Fiber-Based Frequency Comb
637 -- 640Kurt Weyand, Joachim Lüdke, Manfred Kitschke. Locating Magnetic Sensor Elements Inside Their Casing
641 -- 645Anton Widarta, Hitoshi Iida, Tomoteru Kawakami. Attenuation-Measurement System in the Frequency Range of 18-40 GHz
646 -- 650Edwin R. Williams. Toward the SI System Based on Fundamental Constants: Weighing the Electron
651 -- 654Jonathan M. Williams, Dale Henderson, Pravin Patel, Ralf Behr, Luis Palafox. Achieving Sub-100-ns Switching of Programmable Josephson Arrays
655 -- 659Paul S. Wright. Accurate Spectral Analysis of Repetitive Signals Composed of Components Nonsynchronous With the Sampling Clock
660 -- 663Robert Wynands, Roland Schröder, Stefan Weyers. Majorana Transitions in an Atomic Fountain Clock
664 -- 668Sung Hoon Yang, Young Kyu Lee, Youn Jeong Heo, Seong Woo Lee, Chang Bok Lee. Comparison of Time Transfer Using GPS Carrier Phase and Multichannel Two-Way Data in East Asia
669 -- 672Klas Yhland, Jörgen Stenarson. Measurement Uncertainty in Power Splitter Effective Source Match
673 -- 676Er Jun Zang, Jianping Cao, Ye Li, Cheng Yang Li, Yong Kai Deng, Chun Qing Gao. Realization of Four-Pass I::2:: Absorption Cell in 532-nm Optical Frequency Standard