Journal: IEEE Trans. VLSI Syst.

Volume 15, Issue 5

493 -- 494Dimitris Gizopoulos, Robert C. Aitken, S. Kundu. Guest Editorial: Special Section on Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems
495 -- 504Todd J. Foster, Dennis L. Lastor, Padmaraj Singh. First Silicon Functional Validation and Debug of Multicore Microprocessors
505 -- 517Chung-Ho Chen, Chih-Kai Wei, Tai-Hua Lu, Hsun-Wei Gao. Software-Based Self-Testing With Multiple-Level Abstractions for Soft Processor Cores
518 -- 530Loganathan Lingappan, Niraj K. Jha. Satisfiability-Based Automatic Test Program Generation and Design for Testability for Microprocessors
531 -- 540Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra. Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit
541 -- 545Chih-Yen Lo, Chen-Hsing Wang, Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Shin-Moe Wang, Cheng-Wen Wu. STEAC: A Platform for Automatic SOC Test Integration
546 -- 559Divya Arora, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha. Architectural Support for Run-Time Validation of Program Data Properties
560 -- 571Mohamed Elgebaly, Manoj Sachdev. Variation-Aware Adaptive Voltage Scaling System
572 -- 577Antonio Zenteno Ramirez, Guillermo Espinosa, Víctor H. Champac. Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops
578 -- 591Encarnación Castillo, Uwe Meyer-Bäse, Antonio García, Luis Parrilla, Antonio Lloris-Ruíz. IPP@HDL: Efficient Intellectual Property Protection Scheme for IP Cores
592 -- 604Ja Chun Ku, Serkan Ozdemir, Gokhan Memik, Yehea I. Ismail. Thermal Management of On-Chip Caches Through Power Density Minimization
605 -- 609Nachiketh R. Potlapally, Srivaths Ravi, Anand Raghunathan, Ruby B. Lee, Niraj K. Jha. Configuration and Extension of Embedded Processors to Optimize IPSec Protocol Execution