Journal: IEEE Trans. VLSI Syst.

Volume 21, Issue 6

989 -- 999Paul N. Whatmough, Shidhartha Das, David M. Bull, Izzat Darwazeh. Circuit-Level Timing Error Tolerance for Low-Power DSP Filters and Transforms
1000 -- 1012Lucas Francisco Wanner, Charwak Apte, Rahul Balani, Puneet Gupta, Mani B. Srivastava. Hardware Variability-Aware Duty Cycling for Embedded Sensors
1013 -- 1026Young-Geun Choi, Sungjoo Yoo, Sunggu Lee, Jung Ho Ahn, Kangmin Lee. MAEPER: Matching Access and Error Patterns With Error-Free Resource for Low Vcc L1 Cache
1027 -- 1040Isaak Yang, Sung Hoon Jung, Kwang-Hyun Cho. Self-Repairing Digital System With Unified Recovery Process Inspired by Endocrine Cellular Communication
1041 -- 1052Kyu-Nam Shim, Jiang Hu, José Silva-Martínez. Dual-Level Adaptive Supply Voltage System for Variation Resilience
1053 -- 1066Chaochao Feng, Zhonghai Lu, Axel Jantsch, Minxuan Zhang, Zuocheng Xing. Addressing Transient and Permanent Faults in NoC With Efficient Fault-Tolerant Deflection Router
1067 -- 1079Marcel Gort, Jason Helge Anderson. Combined Architecture/Algorithm Approach to Fast FPGA Routing
1080 -- 1093JungHee Lee, Chrysostomos Nicopoulos, Hyung Gyu Lee, Shreepad Panth, Sung Kyu Lim, Jongman Kim. IsoNet: Hardware-Based Job Queue Management for Many-Core Architectures
1094 -- 1102Jingtong Hu, Chun Jason Xue, Qingfeng Zhuge, Wei-Che Tseng, Edwin Hsing-Mean Sha. Data Allocation Optimization for Hybrid Scratch Pad Memory With SRAM and Nonvolatile Memory
1103 -- 1115Eddie Hung, Steven J. E. Wilton. Scalable Signal Selection for Post-Silicon Debug
1116 -- 1128Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring
1129 -- 1142Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects
1143 -- 1153Meng-chou Chang, Wei-Hsiang Chang. Asynchronous Fine-Grain Power-Gated Logic
1154 -- 1164Jun-Ren Su, Te-Wen Liao, Chung-Chih Hung. All-Digital Fast-Locking Pulsewidth-Control Circuit With Programmable Duty Cycle
1165 -- 1169Sumit Jagdish Darak, A. Prasad Vinod, Edmund M.-K. Lai. Efficient Implementation of Reconfigurable Warped Digital Filters With Variable Low-Pass, High-Pass, Bandpass, and Bandstop Responses
1170 -- 1174Christina C.-H. Liao, Allen W.-T. Chen, Louis Y.-Z. Lin, Charles H.-P. Wen. Fast Scan-Chain Ordering for 3-D-IC Designs Under Through-Silicon-Via (TSV) Constraints
1175 -- 1179Hiroshi Fuketa, Koji Hirairi, Tadashi Yasufuku, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai. DDmin-Aware Dual Supply Voltage Technique