Tim Koopman - researchr profile publications

researchr

You are not signed in
Sign in
Sign up

[Clear Filters]

Publications tagged testing

Applying Extended Resolution and Forced Patterns on Random 3-SAT instancesNathan Bruning, Tim Koopman, Siem Kok, Joris Scharpff, Jip-Man Vuong. Technical Report 2009.

Integration and Test Sequencing for Complex SystemsR. Boumen, I. S. M. de Jong, J. M. G. Mestrom, J. M. van de Mortel-Fronczak, J. E. Rooda. tsmc, 39(1):177-187, 2009. [doi]

First International Conference on Software Testing, Verification, and Validation, ICST 2008, Lillehammer, Norway, April 9-11, 2008IEEE Computer Society, 2008.

Hardware and Software: Verification and Testing, Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007, ProceedingsKaren Yorav, editor, Volume 4899 of Lecture Notes in Computer Science, Springer, 2008.

Test Sequencing in Complex Manufacturing SystemsR. Boumen, I. S. M. de Jong, J. W. H. Vermunt, J. M. van de Mortel-Fronczak, J. E. Rooda. tsmc, 38(1):25-37, 2008. [doi]

Hardware and Software, Verification and Testing, Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected PapersEyal Bin, Avi Ziv, Shmuel Ur, editors, Volume 4383 of Lecture Notes in Computer Science, Springer, 2007.

Modelling Short Range Alternating Transitions by Alternating Practical Test FunctionsStefan Pusca. iccS 2007: 1053-1059 [doi]

Testing of Communicating Systems, 18th IFIP TC6/WG6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006, ProceedingsM. Ümit Uyar, Ali Y. Duale, Mariusz A. Fecko, editors, Volume 3964 of Lecture Notes in Computer Science, Springer, 2006.

A singular choice for multiple choiceGudmund Skovbjerg Frandsen, Michael I. Schwartzbach. SIGCSE, 38(4):34-38, 2006. [doi]

Nondeterministic ordered binary decision diagrams with repeated tests and various modes of acceptanceHenrik Brosenne, Matthias Homeister, Stephan Waack. ipl, 98(1):6-10, 2006. [doi]

Computer program TRACK_TEST for calculating parameters and plotting profiles for etch pits in nuclear track materialsD. Nikezic, K. N. Yu. cphysics, 174(2):160-165, 2006. [doi]

A Study on the Standard of Software Quality TestingHye-Jung Jung, Won-Tae Jung, Hae Sool Yang. iccsa 2006: 1052-1059 [doi]

Testing for contagion in ASEAN exchange ratesMichael McAleer, Jason Chee Wei Nam. mcs, 68(5-6):517-525, 2005. [doi]

6th International Workshop on Web Site Evolution (WSE 2004) - Testing, 11 September 2004, Chicago, IL, USAIEEE Computer Society, 2004.

The Mann-Whitney TestDanny P. Wallace. jasis, 55(1):93, 2004. [doi]

Where infants look when impossible things happen: simulating and testing a gaze-direction modelMatthew Schlesinger, Patrick Casey. connection, 16(2):139, 2004. [doi]

Construction of Solutions for Nonintegrable Systems with the Help of the Painleve TestS. Yu. Vernov. iccS 2004: 382-387 [doi]

SAT 2004 - The Seventh International Conference on Theory and Applications of Satisfiability Testing, 10-13 May 2004, Vancouver, BC, Canada, Online Proceedings2004.

Benefits of Modularity and Module Level TestsPatrik Kenger. ifip5-3 2005: 379-386 [doi]

Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USAIEEE Computer Society, 2003.

Do Real Options perform better than Net Present Value? Testing in an artificial financial marketMassimo Sapienza. jasss, 6(3), 2003. [doi]

Testing the descriptive validity of possibility theory in human judgments of uncertaintyEric Raufaste, Rui Da Silva Neves, Claudette Mariné. ai, 148(1-2):197-218, 2003. [doi]

On Derandomizing Tests for Certain Polynomial IdentitiesManindra Agrawal. cocoon 2003: 355 [doi]

A lower bound for the detection/isolation delay in a class of sequential testsIgor V. Nikiforov. TIT, 49(11):3037-3047, 2003.

Correlated, Real Time Multi-spectral Sensor Test and Evaluation (T&E) in an Installed Systems Test Facility (ISTF) Using High Performance ComputingJohn Kriz, Tom Joyner, Ted Wilson, Greg McGraner. iccS 2001: 521-530 [doi]

Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001IEEE Computer Society, 2001.

Electron transfer in bis(hydrazines), a critical test for application of the Marcus modelFredrik Blomgren, Sven Larsson, Stephen F. Nelsen. jcc, 22(6):655-664, 2001. [doi]

Interactive Evaluation of the Ostensive Model Using a New Test Collection of Images with Multiple Relevance AssessmentsIain Campbell. ir, 2(1):85-112, 2000.

The Mutating Metric for Benchmarking TestRohit Kapur, Cy Hay, Thomas W. Williams. dt, 17(3):18-21, 2000. [doi]

Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000IEEE Computer Society, 2000.

On the Average Sensitivity of Testing Square-Free NumbersAnna Bernasconi, Carsten Damm, Igor Shparlinski. cocoon 1999: 291-299 [doi]

Load Testing in an IR Organization: Getting By With a Little Help From My Friends Andrea L. Glaser. cmg 1999: 686-698

Testing for Bounded Faults in RAMsR. David, Janusz A. Brzozowski, Helmut Jürgensen. et, 10(3):197-214, 1997. [doi]

Testing the Performance of Multiple TCP/IP StacksJohn L. Wood, Christopher D. Selvagg, John Q. Walker II. cmg 1997: 626-638

Use of test particle calculations for the derivation of van der Waals parameters used in force fieldsJörg-Rüdiger Hill. jcc, 18(2):211-220, 1997. [doi]

Analyzing Regression Test Selection TechniquesGregg Rothermel, Mary Jean Harrold. TSE, 22(8):529-551, 1996. [doi]

14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USAIEEE Computer Society, 1996.

Flexible matching of test ligands to a 3D pharmacophore using a molecular superposition force field: Comparison of predicted and experimental conformations of inhibitors of three enzymesColin McMartin, Regine S. Bohacek. jcamd, 9(3):237-250, 1995.

Minimum average cost testing for partially ordered componentsMarc J. Lipman, Julia Abrahams. TIT, 41(1):287-291, 1995.

An Efficient Algorithm for Local Testability Problem of Finite State AutomataSam M. Kim, Robert McNaughton. cocoon 1995: 597-606

The Complexity of Finding Replicas Using Equality TestsGudmund Skovbjerg Frandsen, Peter Bro Miltersen, Sven Skyum. mfcs 1993: 463-472

DB2 Version 2 Release 3 Multi-User Performance Test ResultsGlynis Battersby, Peggy De Rossett. cmg 1992: 542-561

Electrical Characterization of Megabit DRAMs, Part 1: External TestingG. Antonin, H.-D. Oberle, Jochen Kolzer. dt, 8(3):36-43, 1991. [doi]

Algorithms for Testing the Satisfiability of Propositional FormulaeGiorgio Gallo, Giampaolo Urbani. jlp, 7(1):45-61, 1989.

Intellibility Tests for Digital Speech Coders with Synthetic Regeneration During FadesRichard L. Zinser, Richard L. Frey, Charles McD. Puckette IV. icc 1986: 1013-1021

Computer Usability Testing: Some Basic ConsiderationsR. H. Spencer. cmg 1985: 836-839

Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981IEEE Computer Society, 1981.

Testing for the Church-Rosser PropertyRonald V. Book, Colm Ó Dúnlaing. TCS, 16:223-229, 1981.

A man-machine principle applied to human behavioral testsZ. Hantos, I. Madarász. actaC, 2:147-156, 1976.

On the Realization of Arbitrary Switching Functions with a Linear Number of TestsWolfgang Coy. ifip 1974: 165-167

runs on WebDSL