The following publications are possibly variants of this publication:
- A Methodology for Trace Signal Selection to Improve Error Detection in Post-Silicon ValidationBinod Kumar, Ankit Jindal, Virendra Singh, Masahiro Fujita. vlsid 2017: 147-152 [doi]
- A trace signal selection algorithm for improved post-silicon debugBinod Kumar, Ankit Jindal, Virendra Singh. ewdts 2016: 1-4 [doi]
- Dynamic Selection of Trace Signals for Post-Silicon DebugKanad Basu, Prabhat Mishra, Priyadarsan Patra, Amir Nahir, Allon Adir. mtv 2013: 62-67 [doi]
- Trace signal selection methods for post silicon debuggingShridhar Choudhary, Amir Masoud Gharehbaghi, Takeshi Matsumoto, Masahiro Fujita. vlsi 2015: 258-263 [doi]
- Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal SelectionBinod Kumar 0001, Kanad Basu, Masahiro Fujita, Virendra Singh. tcad, 39(1):248-261, 2020. [doi]