Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Nima Aghaee, Zebo Peng, Petru Eles. A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs. J. Electronic Testing, 31(5-6):503-523, 2015. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An integrated temperature-cycling acceleration and test technique for 3D stacked ICsNima Aghaee, Zebo Peng, Petru Eles. aspdac 2015: 526-531 [doi] An efficient temperature-gradient based burn-in technique for 3D stacked ICsNima Aghaee, Zebo Peng, Petru Eles. date 2014: 1-4 [doi] Temperature-gradient based test scheduling for 3D stacked ICsNima Aghaee, Zebo Peng, Petru Eles. icecsys 2013: 405-408 [doi]
The following publications are possibly variants of this publication: