The following publications are possibly variants of this publication:
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- Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash MemoryWeihua Liu, Fei Wu 0005, Xiang Chen, Meng Zhang 0014, Yu Wang, Xiangfeng Lu, Changsheng Xie. tos, 18(2), 2022. [doi]
- One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND FlashShaoqi Yang, Xiaohuan Zhao, Kenie Xie, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen. asicon 2023: 1-4 [doi]