Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz. Methods for improving transition delay fault coverage using broadside tests. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
@inproceedings{Devta-PrasannaGKRP05,
title = {Methods for improving transition delay fault coverage using broadside tests},
author = {Narendra Devta-Prasanna and Arun Gunda and P. Krishnamurthy and Sudhakar M. Reddy and Irith Pomeranz},
year = {2005},
doi = {10.1109/TEST.2005.1583983},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583983},
researchr = {https://researchr.org/publication/Devta-PrasannaGKRP05},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}