The following publications are possibly variants of this publication:
- Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point InsertionIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 16(7):931-936, 2008. [doi]
- A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable SignalsNarendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz. iccd 2005: 471-474 [doi]
- Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch TransitionsNarendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz. ats 2005: 202-207 [doi]
- Enhanced Broadside Testing for Improved Transition Fault CoverageIrith Pomeranz, Sudhakar M. Reddy. ats 2007: 479-484 [doi]
- A comment on Improving a nonenumerative method to estimate path delay fault coverage Irith Pomeranz, Sudhakar M. Reddy. tcad, 18(5):665-666, 1999. [doi]
- On Bias in Transition Coverage of Test Sets for Path Delay FaultsIrith Pomeranz, Sudhakar M. Reddy. ats 2010: 349-352 [doi]