The following publications are possibly variants of this publication:
- Analysis of Operation Margin and Read Speed in 6T- and 8T-SRAM with Local Electron Injected Asymmetric Pass Gate TransistorKousuke Miyaji, Kentaro Honda, Shuhei Tanakamaru, Shinji Miyano, Ken Takeuchi. ieicet, 95-C(4):564-571, 2012. [doi]
- Statistical VTH shift variation self-convergence scheme using near threshold VWL injection for local electron injected asymmetric pass gate transistor SRAMKousuke Miyaji, Yasuhiro Shinozuka, Shinji Miyano, Ken Takeuchi. cicc 2011: 1-4 [doi]
- Near Threshold Voltage Word-Line Voltage Injection Self-Convergence Scheme for Local Electron Injected Asymmetric Pass Gate Transistor 6T-SRAMKousuke Miyaji, Yasuhiro Shinozuka, Shinji Miyano, Ken Takeuchi. tcas, 59-I(8):1635-1643, 2012. [doi]
- TH Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron InjectionKousuke Miyaji, Shuhei Tanakamaru, Kentaro Honda, Shinji Miyano, Ken Takeuchi. jssc, 46(9):2180-2188, 2011. [doi]