Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits - researchr publication

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Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah. Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(11):2376-2392, 2006. [doi]

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