The following publications are possibly variants of this publication:
- Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiationSaqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg. ieiceee, 13(17):20160627, 2016. [doi]
- Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg. ieiceee, 13(19):20168001, 2016. [doi]
- Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAMTaiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida. irps 2020: 1-4 [doi]