The following publications are possibly variants of this publication:
- Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS ModelTakuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi. ieicet, 100-A(12):2758-2763, 2017. [doi]
- Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulationsAzusa Oshima, Pieter Weckx, Ben Kaczer, Kazutoshi Kobayashi, Takashi Matsumoto. icicdt 2015: 1-4 [doi]
- Modeling of Random Telegraph Noise under circuit operation - Simulation and measurement of RTN-induced delay fluctuationKyosuke Ito, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera. isqed 2011: 22-27 [doi]