Michitarou Yabuuchi - researchr alias

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Viewing Publication 1 - 7 from 7

2023

Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring OscillatorsKazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto. irps 2023: 1-7 [doi]

2017

Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMSTakuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi. icicdt 2017: 1-4 [doi]

Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS ModelTakuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi. ieicet, 100-A(12):2758-2763, 2017. [doi]

2016

Size Optimization Technique for Logic Circuits that Considers BTI and Process VariationsMichitarou Yabuuchi, Kazutoshi Kobayashi. ipsj, 9:72-78, 2016. [doi]

2014

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAsMichitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi. ieicet, 97-A(12):2367-2372, 2014. [doi]

2012

NBTI-Induced Delay Degradation Analysis of FPGA Routing StructuresMichitarou Yabuuchi, Kazutoshi Kobayashi. ipsj, 5:143-149, 2012. [doi]

2010

Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variationsMichitarou Yabuuchi, Kazutoshi Kobayashi. fpt 2010: 417-420 [doi]

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