The following publications are possibly variants of this publication:
- IDDQ Testing for Deep-Submicron ICs: Challenges and SolutionsZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy. dt, 19(2):24-33, 2002. [doi]
- IDDQ Testing for Deep Submicron ICs: Challenges and SolutionsZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy 0001. latw 2002: 186-192
- Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI TestingChih-Wen Lu, Chung-Len Lee, Chauchin Su, Jwu-E Chen. et, 18(1):89-97, 2002. [doi]
- Configurable 2-D Linear Feedback Shift Registers for VLSI Built-in Self-test DesignsChien-In Henry Chen, Yingjie Zhou. vlsi, 2000(2):149-159, 2000. [doi]