The following publications are possibly variants of this publication:
- Statistical Gate-Delay Modeling with Intra-Gate VariabilityKenichi Okada, Kento Yamaoka, Hidetoshi Onodera. ieiceta, 86-A(12):2914-2922, 2003. [doi]
- Statistical modeling of gate-delay variation with consideration of intra-gate variabilityKen-ichi Okada, Kento Yamaoka, Hidetoshi Onodera. iscas 2003: 513-516 [doi]
- A Statistical Gate-Delay Model Considering Intra-Gate VariabilityKen-ichi Okada, Kento Yamaoka, Hidetoshi Onodera. iccad 2003: 908-913 [doi]
- Realistic Delay Calculation Based on Measured Intra-Chip and Inter-Chip Variabilities with the Size DependenceKenichi Okada, Hidetoshi Onodera. ieiceta, 86-A(4):746-751, 2003. [doi]