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- Test compaction for transition faults under transparent-scanIrith Pomeranz, Sudhakar M. Reddy. date 2006: 1264-1269 [doi]
- Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation PointsIrith Pomeranz. tcad, 37(6):1278-1287, 2018. [doi]
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- Topping Off Test Sets Under Bounded Transparent ScanIrith Pomeranz. tcad, 42(1):341-345, 2023. [doi]
- Reducing the switching activity of test sequences under transparent-scanIrith Pomeranz, Sudhakar M. Reddy. todaes, 16(2):17, 2011. [doi]
- Reducing the input test data volume under transparent scanIrith Pomeranz. iet-cdt, 8(1):1-10, 2014. [doi]
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- Test compaction methods for transition faults under transparent-scanIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 3(4):315-328, 2009. [doi]