The following publications are possibly variants of this publication:
- Test Compaction by Test Removal Under Transparent ScanIrith Pomeranz. tvlsi, 27(2):496-500, 2019. [doi]
- Compaction of Compressed Bounded Transparent-Scan Test SetsIrith Pomeranz. glvlsi 2022: 339-343 [doi]
- Test compaction for transition faults under transparent-scanIrith Pomeranz, Sudhakar M. Reddy. date 2006: 1264-1269 [doi]
- Preponing Fault Detections for Test Compaction Under Transparent ScanIrith Pomeranz. tvlsi, 30(10):1543-1547, 2022. [doi]
- Test compaction methods for transition faults under transparent-scanIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 3(4):315-328, 2009. [doi]
- Topping Off Test Sets Under Bounded Transparent ScanIrith Pomeranz. tcad, 42(1):341-345, 2023. [doi]
- Test Compaction by Sharing of Transparent-Scan Sequences Among Logic BlocksIrith Pomeranz. tvlsi, 22(4):792-802, 2014. [doi]
- Static Test Compaction Using Independent Suffixes of a Transparent-Scan SequenceIrith Pomeranz. tcad, 41(4):1130-1141, 2022. [doi]
- Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operationsIrith Pomeranz, Sudhakar M. Reddy. tcad, 22(12):1663-1670, 2003. [doi]
- Pass/Fail Data for Logic Diagnosis Under Bounded Transparent ScanIrith Pomeranz. tcad, 41(11):4862-4872, 2022. [doi]
- On the effects of test compaction on defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. vts 1996: 430-437 [doi]
- Improved n-Detection Test Sequences Under Transparent ScanIrith Pomeranz, Sudhakar M. Reddy. tcad, 25(11):2492-2501, 2006. [doi]