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Srivaths Ravi, Niraj K. Jha. Fast test generation for circuits with RTL and gate-level views. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1068-1077, IEEE Computer Society, 2001.
Possibly Related PublicationsThe following publications are possibly variants of this publication: Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuitsLoganathan Lingappan, Vijay Gangaram, Niraj K. Jha. vlsid 2007: 504-512 [doi] Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL CircuitsLoganathan Lingappan, Vijay Gangaram, Niraj K. Jha, Sreejit Chakravarty. tvlsi, 17(5):697-708, 2009. [doi]
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