An automorphic approach to verification pattern generation for SoC design verification using port-order fault model

Chun-Yao Wang, Shing-Wu Tung, Jing-Yang Jou. An automorphic approach to verification pattern generation for SoC design verification using port-order fault model. IEEE Trans. on CAD of Integrated Circuits and Systems, 21(10):1225-1232, 2002. [doi]

Abstract

Abstract is missing.