The following publications are possibly variants of this publication:
- Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BISTDong Xiang, Ming-Jing Chen, Hideo Fujiwara. ats 2005: 126-131 [doi]
- Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BISTDong Xiang, Mingjing Chen, Hideo Fujiwara. TC, 56(12):1619-1628, 2007. [doi]
- Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan ArhcitectureHideo Fujiwara, Jiaguang Sun, Krishnendu Chakrabarty, Yang Zhao 0001, Dong Xiang. ats 2006: 299-306 [doi]