Marnix Tack - researchr alias

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Viewing Publication 1 - 7 from 7

2025

Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate BiasS. L. Longato, Davide Favero, Arno Stockman, Arianna Nardo, Piet Vanmeerbeek, Marnix Tack, Gaudenzio Meneghesso, Enrico Zanoni, C. De Santi, Matteo Meneghini. irps 2025: 22 [doi]

2024

$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and LayoutDavide Favero, Carlo De Santi, Arno Stockman, Arianna Nardo, Piet Vanmeerbeek, Marnix Tack, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. irps 2024: 1-4 [doi]

2017

Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTsManuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà. tie, 64(11):9012-9022, 2017. [doi]

2015

Technology and design of GaN power devicesPeter Moens, A. Banerjee, P. Coppens, A. Constant, Piet Vanmeerbeek, Z. Li, F. Declercq, L. De Schepper, H. De Vleeschouwer, C. Liu, B. Padmanabhan, W. Jeon, J. Guo, A. Salih, Marnix Tack. essderc 2015: 64-67 [doi]

2012

TM power devicesJ. Rhayem, B. Besbes, R. Blecic, Sergey Bychikhin, G. Haberfehlner, Dionyz Pogany, B. Desoete, Renaud Gillon, A. Wieers, Marnix Tack. mj, 43(9):618-623, 2012. [doi]

2008

Next Generation Smart Power Technologies - Challenges and Innovations Enabling Complex SoC IntegrationMarnix Tack, Peter Moens, Renaud Gillon, Johan Janssens, Stefan Van Roeyen, Jan Sevenhans. isscc 2008: 296-297 [doi]

2001

A compact test structure for characterisation of leakage currents in sub-micron CMOS technologiesZhenqiu Ning, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, Paul Raes. mr, 41(12):1939-1945, 2001. [doi]

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