| 2 | -- | 3 | . Editor-in-Chief s Message |
| 4 | -- | 5 | . Disaster Recovery Centers |
| 6 | -- | 17 | Karlheinz Hafner, Hartmut C. Ritter, Thomas M. Schwair, Stefan Wallstab, Michael Deppermann, Jürgen Gessner, Stefan Koesters, Wolf-Dietrich Moeller, Gerd Sandweg. Design and Test of an Integrated Cryptochip |
| 18 | -- | 23 | David A. Fechser. A Methodology for Debugging ASIC Prototypes in the Field |
| 25 | -- | 38 | John W. Sheppard, William R. Simpson. A Mathematical Model for Integrated Diagnostics |
| 39 | -- | 51 | Jochen Kolzer, Johann Otto. Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing |
| 52 | -- | 62 | Richard Absher. Test Engineering Education is Rational, Feasible, and Relevant |
| 64 | -- | 77 | I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick. Economic Effects in Design and Test |
| 82 | -- | 84 | . Book Review |
| 84 | -- | 86 | . Conference Reports |
| 87 | -- | 0 | . Direct Access Network |
| 92 | -- | 93 | . TTTC Newsletter |
| 94 | -- | 95 | . DATC Newsletter |