| 463 | -- | 469 | Chunlei Wu, SuYing Yao, Corinne Bergès. Leakage current study and relevant defect localization in integrated circuit failure analysis |
| 470 | -- | 480 | A. S. N. Pereira, R. Giacomini. An accurate closed-expression model for FinFETs parasitic resistance |
| 481 | -- | 485 | Chie-In Lee, Wei-Cheng Lin. MOSFET channel resistance characterization from the triode region to impact ionization region with the inductive breakdown network |
| 486 | -- | 491 | Xiangming Xu, Jingfeng Huang, Han Yu, Biao Ma, Peng-fei Wang, David Wei Zhang. Elimination of stress induced dislocation in deep Poly Sinker LDMOS technology |
| 492 | -- | 497 | Hatice Gül Sezgin, Yasin Özçelep. Characterization and modeling of power MOSFET switching times variations under constant electrical stress |
| 498 | -- | 507 | G. G. Fischer, G. Sasso. Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions |
| 508 | -- | 513 | Cunbo Zhang, Jian-de Zhang, Honggang Wang, Guangxing Du. Burnout properties of microwave pulse injected on GaAs PHEMT |
| 514 | -- | 519 | Cen Xiong, Shuhuan Liu, Yonghong Li, Du Tang, Jinxin Zhang, Xuecheng Du, Chaohui He. Hot carrier effect on the bipolar transistors' response to electromagnetic interference |
| 520 | -- | 526 | Yang Wang, Xiangliang Jin, Liu Yang, Qi Jiang, Huihui Yuan. Robust dual-direction SCR with low trigger voltage, tunable holding voltage for high-voltage ESD protection |
| 527 | -- | 537 | Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang. A return on investment analysis of applying health monitoring to LED lighting systems |
| 538 | -- | 546 | Atif Alkhazaili, Mohammad M. Hamasha, Gihoon Choi, Susan Lu, Charles R. Westgate. Reliability of thin films: Experimental study on mechanical and thermal behavior of indium tin oxide and poly(3, 4-ethylenedioxythiophene) |
| 547 | -- | 551 | Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir. Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions |
| 552 | -- | 557 | Emre Özkol, Franziska Brem, Chunlei Liu. Improving the power cycling performance of IGBT modules by plating the emitter contact |
| 558 | -- | 564 | K. Dutta, B. Bhowmik, A. Hazra, P. P. Chattopadhyay, P. Bhattacharyya. An efficient BTX sensor based on p-type nanoporous titania thin films |
| 565 | -- | 571 | Choon-W. Nahm. 1.83-based varistors |
| 572 | -- | 581 | Seongjun Lee, Jonghoon Kim, Bo-Hyung Cho. Maximum pulse current estimation for high accuracy power capability prediction of a Li-Ion battery |
| 582 | -- | 587 | Elviz George, Michael D. Osterman, Michael G. Pecht. An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model |
| 588 | -- | 595 | Ee-Hua Wong. The fundamentals of thermal-mass diffusion analogy |
| 596 | -- | 601 | Li Yang, Yaocheng Zhang, Chengchao Du, Jun Dai, Ning Zhang. Effect of aluminum concentration on the microstructure and mechanical properties of Sn-Cu-Al solder alloy |
| 602 | -- | 607 | J. Gomes, M. Mayer, B. Lin. Development of a fast method for optimization of Au ball bond process |
| 608 | -- | 612 | Yi-Wei Tseng, Fei-Yi Hung, Truan-Sheng Lui. Microstructure, tensile and electrical properties of gold-coated silver bonding wire |
| 613 | -- | 622 | Xue-Ru Guo, Wen-Bin Young. Vacuum effect on the void formation of the molded underfill process in flip chip packaging |
| 623 | -- | 629 | Wenguo Zhang, Jian-Hua Ma, Li-Lan Gao, Zhe Zhang, Hong Gao. Fatigue life and resistance analysis of COG assemblies under hygrothermal aging |
| 630 | -- | 636 | Cheng-Han Wu, Weng-Sing Hwang. The effect of the echo-time of a bipolar pulse waveform on molten metallic droplet formation by squeeze mode piezoelectric inkjet printing |
| 637 | -- | 644 | Qi Jiang, Huihui Yuan, Yang Wang, Xiangliang Jin. Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS |
| 645 | -- | 653 | Hao Cai, You Wang, Kaikai Liu, Lirida Alves de Barros Naviner, Hervé Petit, Jean-François Naviner. Cross-layer investigation of continuous-time sigma-delta modulator under aging effects |
| 654 | -- | 661 | Anna Richelli, Gilbert Matig-a, Jean-Michel Redoute. Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18 μm CMOS |
| 662 | -- | 670 | Arwa Ben Dhia, Mariem Slimani, Hao Cai, Lirida A. B. Naviner. A dual-rail compact defect-tolerant multiplexer |
| 671 | -- | 678 | Pawel Leczycki, Artur Andrzejczak, Piotr Pietrzak, Bartosz Pekoslawski, Andrzej Napieralski. Extended Sensor Reliability Evaluation Method in multi-sensor control systems |
| 679 | -- | 695 | Mohsen Jahanshahi, Fathollah Bistouni. Improving the reliability of the Benes network for use in large-scale systems |
| 696 | -- | 703 | Ting An, Kaikai Liu, Hao Cai, Lirida A. B. Naviner. Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method |
| 704 | -- | 712 | Atin Mukherjee, Anindya Sundar Dhar. Real-time fault-tolerance with hot-standby topology for conditional sum adder |