467 | -- | 474 | Jacob Savir, Paul H. Bardell. On Random Pattern Test Length |
475 | -- | 485 | Dhananjay Brahme, Jacob A. Abraham. Functional Testing of Microprocessors |
486 | -- | 492 | Anton T. Dahbura, Gerald M. Masson. An ::::O(n:::2.5:::):::: Fault Identification Algorithm for Diagnosable Systems |
493 | -- | 506 | Yuval Tamir, Carlo H. Séquin. Design and Application of Self-Testing Comparators Implemented with MOS PLA s |
518 | -- | 528 | Kuang-Hua Huang, Jacob A. Abraham. Algorithm-Based Fault Tolerance for Matrix Operations |
529 | -- | 540 | Kang G. Shin, Yann-Hang Lee. Error Detection Process - Model, Design, and Its Impact on Computer Performance |
541 | -- | 546 | Edward J. McCluskey. Verification Testing - A Pseudoexhaustive Test Technique |
546 | -- | 550 | Joseph L. A. Hughes, Edward J. McCluskey, David J. Lu. Design of Totally Self-Checking Comparators with an Arbitrary Number of Inputs |
550 | -- | 554 | David G. Furchtgott, John F. Meyer. A Performability Solution Method for Degradable Nonrepairable Systems |
554 | -- | 560 | John Paul Shen, F. Joel Ferguson. The Design of Easily Tastabel VLSI Array Multipliers |
560 | -- | 564 | El Mostapha Aboulhamid, Eduard Cerny. Built-In Testing of One-Dimensional Unilateral Iterative Arrays |
564 | -- | 568 | Paola Velardi, Ravishankar K. Iyer. A Study of Software Failures and Recovery in the MVS Operating System |
568 | -- | 572 | Cauligi S. Raghavendra, Algirdas Avizienis, Milos D. Ercegovac. Fault Tolerance in Binary Tree Architectures |
572 | -- | 575 | Hao Dong. Modified Berger Codes for Detection of Unidirectional Errors |
575 | -- | 578 | Bella Bose, T. R. N. Rao. Unidirectional Error Codes for Shift-Register Memories |
578 | -- | 583 | Eiji Fujiwara, Nobuo Mutoh, Kohji Matsuoka. A Self-Testing Group-Parity Prediction Checker and Its Use for Built-In Testing |
583 | -- | 588 | Bella Bose, Der Jei Lin. PLA Implementation of ::::k::::-out-of-::::n:::: Code TSC Checker |