Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 30, Issue 8

1089 -- 1102Husni M. Habal, Helmut Graeb. Constraint-Based Layout-Driven Sizing of Analog Circuits
1103 -- 1113Jie Zhang, Nishant Patil, Arash Hazeghi, H.-S. Philip Wong, Subhasish Mitra. Characterization and Design of Logic Circuits in the Presence of Carbon Nanotube Density Variations
1114 -- 1127Seungwhun Paik, Seonggwan Lee, Youngsoo Shin. Retiming Pulsed-Latch Circuits With Regulating Pulse Width
1128 -- 1140Wei Hu, Jason Oberg, Ali Irturk, Mohit Tiwari, Timothy Sherwood, Dejun Mu, Ryan Kastner. Theoretical Fundamentals of Gate Level Information Flow Tracking
1141 -- 1151Jorge Fernandez Villena, L. Miguel Silveira. Multi-Dimensional Automatic Sampling Schemes for Multi-Point Modeling Methodologies
1152 -- 1162Qiang Ma 0002, Zaichen Qian, Evangeline F. Y. Young, Hai Zhou. MSV-Driven Floorplanning
1163 -- 1172Se Hun Kim, Saibal Mukhopadhyay, Wayne Wolf. Modeling and Analysis of Image Dependence and Its Implications for Energy Savings in Error Tolerant Image Processing
1173 -- 1183Ali Irturk, Janarbek Matai, Jason Oberg, Jeffrey Su, Ryan Kastner. Simulate and Eliminate: A Top-to-Bottom Design Methodology for Automatic Generation of Application Specific Architectures
1184 -- 1196Jer Min Jou, Yun-Lung Lee, Sih-Sian Wu. Model-Driven Design and Generation of New Multi-Facet Arbiters: From the Design Model to the Hardware Synthesis
1197 -- 1210Paul Bogdan, Radu Marculescu. Hitting Time Analysis for Fault-Tolerant Communication at Nanoscale in Future Multiprocessor Platforms
1211 -- 1224Ivan Beretta, Vincenzo Rana, David Atienza, Donatella Sciuto. A Mapping Flow for Dynamically Reconfigurable Multi-Core System-on-Chip Design
1225 -- 1238Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer. Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression
1239 -- 1252Görschwin Fey, André Sülflow, Stefan Frehse, Rolf Drechsler. Effective Robustness Analysis Using Bounded Model Checking Techniques
1253 -- 1257Irith Pomeranz. Generation of Multi-Cycle Broadside Tests
1258 -- 1262Ahmed Shebaita, Debasish Das, Dusan Petranovic, Yehea I. Ismail. A Novel Moment Based Framework for Accurate and Efficient Static Timing Analysis