Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 36, Issue 7

1061 -- 1074Fabrizio Riente, Giovanna Turvani, Marco Vacca, Massimo Ruo Roch, Maurizio Zamboni, Mariagrazia Graziano. ToPoliNano: A CAD Tool for Nano Magnetic Logic
1075 -- 1088Peter Debacker, Kwangsoo Han, Andrew B. Kahng, Hyein Lee, Praveen Raghavan, Lutong Wang. MILP-Based Optimization of 2-D Block Masks for Timing-Aware Dummy Segment Removal in Self-Aligned Multiple Patterning Layouts
1089 -- 1102Kan Wang, Sheqin Dong, Fengxian Jiao. TSF3D: MSV-Driven Power Optimization for Application-Specific 3D Network-on-Chip
1103 -- 1112Wai-Kei Mak, Wan-Sin Kuo, Shi-Han Zhang, Seong-I Lei, Chris Chu. Minimum Implant Area-Aware Placement and Threshold Voltage Refinement
1113 -- 1125Xiaoqing Xu, Yibo Lin, Meng Li, Jiaojiao Ou, Brian Cline, David Z. Pan. Redundant Local-Loop Insertion for Unidirectional Routing
1126 -- 1139Vinicius S. Livramento, Derong Liu, Salim Chowdhury, Bei Yu, Xiaoqing Xu, David Z. Pan, José Luís Almada Güntzel, Luiz C. V. dos Santos. Incremental Layer Assignment Driven by an External Signoff Timing Engine
1140 -- 1152Yibo Lin, Bei Yu, Biying Xu, David Z. Pan. Triple Patterning Aware Detailed Placement Toward Zero Cross-Row Middle-of-Line Conflict
1153 -- 1166Mohamad Najem, Pascal Benoit, Mohamad El Ahmad, Gilles Sassatelli, Lionel Torres. A Design-Time Method for Building Cost-Effective Run-Time Power Monitoring
1167 -- 1180Jie Guo, Wujie Wen, Jingtong Hu, Danghui Wang, Hai Helen Li, Yiran Chen. FlexLevel NAND Flash Storage System Design to Reduce LDPC Latency
1181 -- 1192Yaojun Zhang, Bonan Yan, XiaoBin Wang, Yiran Chen. Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design
1193 -- 1202Eddie Hung, Tim Todman, Wayne Luk. Transparent In-Circuit Assertions for FPGAs
1203 -- 1214Renhai Chen, Yi Wang 0003, Jingtong Hu, Duo Liu, Zili Shao, Yong Guan. vFlash: Virtualized Flash for Optimizing the I/O Performance in Mobile Devices
1215 -- 1225Irith Pomeranz. Identifying Biases of a Defect Diagnosis Procedure
1226 -- 1230Xiaoping Wang, Bowen Xu, Lin Chen. Efficient Memristor Model Implementation for Simulation and Application
1231 -- 1235Irith Pomeranz. Clock Sequences for Increasing the Fault Coverage of Functional Test Sequences