Journal: IEEE Trans. VLSI Syst.

Volume 12, Issue 4

337 -- 338Jeff Alan Davis. Guest Editorial
339 -- 348Joni Dambre, Dirk Stroobandt, Jan Van Campenhout. Toward the accurate prediction of placement wire length distributions in VLSI circuits
349 -- 358Mario R. Casu, Mariagrazia Graziano, Guido Masera, Gianluca Piccinini, Maurizio Zamboni. An electromigration and thermal model of power wires for a priori high-level reliability prediction
359 -- 366Shamik Das, Anantha Chandrakasan, Rafael Reif. Calibration of Rent s rule models for three-dimensional integrated circuits
367 -- 372James W. Joyner, Payman Zarkesh-Ha, James D. Meindl. Global interconnect design in a three-dimensional system-on-a-chip
373 -- 380Suhrid A. Wadekar, Alice C. Parker. Interconnect-based system-level energy and power prediction to guide architecture exploration
381 -- 385PariVallal Kannan, Shankar Balachandran, Dinesh Bhatia. On metrics for comparing interconnect estimation methods for FPGAs
386 -- 394Andrey V. Mezhiba, Eby G. Friedman. Scaling trends of on-chip power distribution noise
395 -- 407Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim. Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects
408 -- 419Iouliia Skliarova, António de Brito Ferrari. A software/reconfigurable hardware SAT solver
420 -- 436Khaled Benkrid, Danny Crookes. From application descriptions to hardware in seconds: a logic-based approach to bridging the gap
437 -- 447Shizhong Mei, Yehea I. Ismail. Modeling skin and proximity effects with reduced realizable RL circuits