1132 | -- | 1147 | Jeong-Taek Kong. CAD for nanometer silicon design challenges and success |
1148 | -- | 1155 | Andrey V. Mezhiba, Eby G. Friedman. Impedance characteristics of power distribution grids in nanoscale integrated circuits |
1156 | -- | 1166 | Alexandre Schmid, Yusuf Leblebici. Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors |
1167 | -- | 1173 | Luigi Fortuna, Manuela La Rosa, Donata Nicolosi, Domenico Porto. Nanoscale system dynamical behaviors: from quantum-dot-based cell to 1-D arrays |
1174 | -- | 1181 | E. Y. Chou, J. C. Huang, M. S. Huang, M. C. Hsieh, A. Y. Hsu. Baud-rate channel equalization in nanometer technologies |
1182 | -- | 1191 | J.-L. Lai, P. C.-Y. Wu. Architectural design and analysis of learnable self-feedback ratio-memory cellular nonlinear network (SRMCNN) for nanoelectronic systems |
1192 | -- | 1200 | Hong-Yi Huang, Shih-Lun Chen. Interconnect accelerating techniques for sub-100-nm gigascale systems |
1201 | -- | 1208 | Garrett S. Rose, Matthew M. Ziegler, Mircea R. Stan. Large-signal two-terminal device model for nanoelectronic circuit analysis |
1209 | -- | 1213 | Chaohong Hu, Sorin Cotofana, Jianfei Jiang, Qiyu Cai. Analog-to-digital converter based on single-electron tunneling transistors |
1214 | -- | 1220 | C. Dwyer, L. Vicci, J. Poulton, D. Erie, Richard Superfine, Sean Washburn, Russell M. Taylor II. The design of DNA self-assembled computing circuitry |
1221 | -- | 1233 | Yuh-Fang Tsai, D. E. Duarte, Narayanan Vijaykrishnan, Mary Jane Irwin. Characterization and modeling of run-time techniques for leakage power reduction |
1234 | -- | 1243 | Kartik Mohanram, Nur A. Touba. Lowering power consumption in concurrent checkers via input ordering |
1244 | -- | 1248 | Ramamurti Chandramouli, Vamsi K. Srikantam. Multimode power modeling and maximum-likelihood estimation |
1248 | -- | 1253 | Antonio Blotti, Roberto Saletti. Ultralow-power adiabatic circuit semi-custom design |
1253 | -- | 1257 | Gerald Esch Jr., Tom Chen. Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations |