The following publications are possibly variants of this publication:
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- Coupling-based resistive-open defects in TAS-MRAM architecturesJ. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay. ets 2012: 1 [doi]
- Impact of Resistive-Bridging Defects in SRAM Core-CellRenan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. delta 2010: 265-269 [doi]