The following publications are possibly variants of this publication:
- LFSR-based generation of boundary-functional broadside testsIrith Pomeranz. iet-cdt, 14(2):61-68, 2020. [doi]
- LFSR-Based Generation of Close-to-Functional Broadside TestsIrith Pomeranz. todaes, 23(4), 2018. [doi]
- Definition and generation of partially-functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 3(1):1-13, 2009. [doi]
- Built-in generation of functional broadside testsIrith Pomeranz. date 2011: 1297-1302 [doi]
- On reset based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. date 2010: 1438-1443 [doi]
- Generation of Functional Broadside Tests for Transition FaultsIrith Pomeranz, Sudhakar M. Reddy. tcad, 25(10):2207-2218, 2006. [doi]
- Functional Broadside Templates for Low-Power Test GenerationIrith Pomeranz. tvlsi, 21(12):2321-2325, 2013. [doi]
- Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside TestsIrith Pomeranz. tvlsi, 21(7):1359-1363, 2013. [doi]
- Two-dimensional partially functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 5(4):247-253, 2011. [doi]
- Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside TestsIrith Pomeranz. iolts 2020: 1-4 [doi]
- Low-Power Test Generation by Merging of Functional Broadside Test CubesIrith Pomeranz. tvlsi, 22(7):1570-1582, 2014. [doi]
- Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load TestsIrith Pomeranz. tcad, 39(12):5238-5246, 2020. [doi]