The following publications are possibly variants of this publication:
- EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverageIrith Pomeranz, Sudhakar M. Reddy. vts 1997: 329-335 [doi]
- Improving the stuck-at fault coverage of functional test sequences by using limited-scan operationsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 12(7):780-788, 2004. [doi]
- On improving the stuck-at fault coverage of functional test sequences by using limited-scan operationsIrith Pomeranz, Sudhakar M. Reddy. itc 2001: 211-220
- Test vector chains for increasing the fault coverage and numbers of detectionsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 3(2):222-233, 2009. [doi]
- Test vector chains for increased targeted and untargeted fault coverageIrith Pomeranz, Sudhakar M. Reddy. aspdac 2008: 663-666 [doi]
- Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test SequencesIrith Pomeranz, Sudhakar M. Reddy. dft 2009: 358-366 [doi]
- Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point InsertionIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 16(7):931-936, 2008. [doi]