The following publications are possibly variants of this publication:
- Broadside and Functional Broadside Tests for Partial-Scan CircuitsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(6):1104-1108, 2011. [doi]
- Maintaining proximity to functional operation conditions under enhanced-scan tests based on functional broadside testsIrith Pomeranz. dft 2012: 239-244 [doi]
- Functional Broadside Tests With Incompletely Specified Scan-In StatesIrith Pomeranz. tcad, 32(9):1445-1449, 2013. [doi]
- Scan Shift Power of Functional Broadside TestsIrith Pomeranz. tcad, 30(9):1416-1420, 2011. [doi]
- Functional Broadside Tests Under an Expanded Definition of Functional Operation ConditionsIrith Pomeranz, Sudhakar M. Reddy. tcad, 28(1):121-129, 2009. [doi]
- Design-for-Testability for Functional Broadside Tests under Primary Input ConstraintsIrith Pomeranz. todaes, 21(2):35, 2016. [doi]
- An Adjacent Switching Activity Metric under Functional Broadside TestsIrith Pomeranz. TC, 62(2):404-410, 2013. [doi]
- Fast Identification of Undetectable Transition Faults under Functional Broadside TestsIrith Pomeranz. TC, 61(6):905-910, 2012. [doi]
- Using piecewise-functional broadside tests for functional broadside test compactionIrith Pomeranz. vts 2017: 1-6 [doi]
- On reset based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. date 2010: 1438-1443 [doi]