The following publications are possibly variants of this publication:
- Static Compaction of Delay Tests Considering Power Supply NoiseJing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker. vts 2005: 235-240 [doi]
- Levelized low cost delay test compaction considering IR-drop induced power supply noiseZhongwei Jiang, Zheng Wang, Jing Wang 0006, D. M. H. Walker. vts 2011: 52-57 [doi]
- Power Supply Noise in Delay TestingJing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger. itc 2006: 1-10 [doi]