Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 21, Issue 6

645 -- 661Geert Van der Plas, Jan Vandenbussche, Georges G. E. Gielen, Willy M. C. Sansen. A layout synthesis methodology for array-type analog blocks
662 -- 673Fei Yuan, Ajoy Opal. An efficient transient analysis algorithm for mildly nonlinearcircuits
674 -- 684Gi-Joon Nam, Karem A. Sakallah, Rob A. Rutenbar. A new FPGA detailed routing approach via search-based Booleansatisfiability
685 -- 693Min Ouyang, Michel Toulouse, Krishnaiyan Thulasiraman, Fred Glover, Jitender S. Deogun. Multilevel cooperative search for the circuit/hypergraphpartitioning problem
694 -- 705Wanli Jiang, Bapiraju Vinnakota. Statistical threshold formulation for dynamic I::dd:: test
706 -- 714Irith Pomeranz, Sudhakar M. Reddy. Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences
715 -- 722Anshuman Chandra, Krishnendu Chakrabarty. Test data compression and decompression based on internal scanchains and Golomb coding
723 -- 730Yungseon Eo, Jongin Shim, William R. Eisenstadt. A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines
731 -- 738Antoni Ferré, Joan Figueras. Leakage power bounds in CMOS digital technologies
739 -- 745Y. Shin, T. Sakurai. Power distribution analysis of VLSI interconnects using model orderreduction