Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 25, Issue 10

1889 -- 1903Lihong Zhang, Rabin Raut, Yingtao Jiang, Ulrich Kleine. Placement Algorithm in Analog-Layout Designs
1904 -- 1921Jordi Cortadella, Alex Kondratyev, Luciano Lavagno, Christos P. Sotiriou. Desynchronization: Synthesis of Asynchronous Circuits From Synchronous Specifications
1922 -- 1934Prasenjit Basu, Sayantan Das, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti, Chunduri Rama Mohan, Limor Fix, Roy Armoni. Design-Intent Coverage - A New Paradigm for Formal Property Verification
1935 -- 1949J.-G. Lee, C. M. Kyung. PrePack: Predictive Packetizing Scheme for Reducing Channel Traffic in Transaction-Level Hardware/Software Co-Emulation
1950 -- 1968Sebastien Bilavarn, Guy Gogniat, Jean Luc Philippe, Lilian Bossuet. Design Space Pruning Through Early Estimations of Area/Delay Tradeoffs for FPGA Implementations
1969 -- 1989Chao Huang, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha. Use of Computation-Unit Integrated Memories in High-Level Synthesis
1990 -- 2000Dong-U Lee, Altaf Abdul Gaffar, Ray C. C. Cheung, Oskar Mencer, Wayne Luk, George A. Constantinides. Accuracy-Guaranteed Bit-Width Optimization
2001 -- 2011Sarma B. K. Vrudhula, Janet Meiling Wang, Praveen Ghanta. Hermite Polynomial Based Interconnect Analysis in the Presence of Process Variations
2012 -- 2022Anup Hosangadi, Farzan Fallah, Ryan Kastner. Optimizing Polynomial Expressions by Algebraic Factorization and Common Subexpression Elimination
2023 -- 2034Yan Lin, Lei He. Dual-Vdd Interconnect With Chip-Level Time Slack Allocation for FPGA Power Reduction
2035 -- 2051Manish Verma, Lars Wehmeyer, Peter Marwedel. Cache-Aware Scratchpad-Allocation Algorithms for Energy-Constrained Embedded Systems
2052 -- 2061Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang, Kaushik Roy. Modeling and Analysis of Leakage Currents in Double-Gate Technologies
2062 -- 2075N. Wong, V. Balakrishnan, C.-K. Koh, T. S. Ng. Two Algorithms for Fast and Accurate Passivity-Preserving Model Order Reduction
2076 -- 2087Andrew A. Kennings, Kristofer Vorwerk. Force-Directed Methods for Generic Placement
2088 -- 2102Gang Wang, Satish Sivaswamy, Cristinel Ababei, Kia Bazargan, Ryan Kastner, Elaheh Bozorgzadeh. Statistical Analysis and Design of HARP FPGAs
2103 -- 2117Lin Zhong, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha. RTL-Aware Cycle-Accurate Functional Power Estimation
2118 -- 2128J. Cervenka, W. Wessner, E. Al-Ani, Tibor Grasser, Siegfried Selberherr. Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations
2129 -- 2139W. Wessner, J. Cervenka, Clemens Heitzinger, Andreas Hössinger, Siegfried Selberherr. Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes
2140 -- 2155Ming Zhang, Naresh R. Shanbhag. Soft-Error-Rate-Analysis (SERA) Methodology
2156 -- 2169Dionysios Kouroussis, Rubil Ahmadi, Farid N. Najm. Voltage-Aware Static Timing Analysis
2170 -- 2180Chandramouli Visweswariah, K. Ravindran, K. Kalafala, Steven G. Walker, S. Narayan, Daniel K. Beece, J. Piaget, N. Venkateswaran, Jeffrey G. Hemmett. First-Order Incremental Block-Based Statistical Timing Analysis
2181 -- 2192Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker. Simulating Resistive-Bridging and Stuck-At Faults
2193 -- 2206Loganathan Lingappan, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha, Srimat T. Chakradhar. Test-Volume Reduction in Systems-on-a-Chip Using Heterogeneous and Multilevel Compression Techniques
2207 -- 2218Irith Pomeranz, Sudhakar M. Reddy. Generation of Functional Broadside Tests for Transition Faults
2219 -- 2227Irith Pomeranz, Sudhakar M. Reddy. Using Dummy Bridging Faults to Define Reduced Sets of Target Faults
2228 -- 2231Marc-André Cantin, Yvon Savaria, D. Prodanos, Pierre Lavoie. A Metric for Automatic Word-Length Determination of Hardware Datapaths
2231 -- 2241M. Capobianchi, V. Labay, F. Shi, G. Mizushima. Simulating the Electrical Behavior of Integrated Circuit Devices in the Presence of Thermal Interactions
2241 -- 2248Valentina Ciriani, Anna Bernasconi, Rolf Drechsler. Testability of SPP Three-Level Logic Networks in Static Fault Models
2248 -- 2257Jacob R. Minz, Sung Kyu Lim. Block-level 3-D Global Routing With an Application to 3-D Packaging
2258 -- 2264S.-W. Tu, Y.-W. Chang, J.-Y. Jou. RLC Coupling-Aware Simulation and On-Chip Bus Encoding for Delay Reduction
2264 -- 2275Janet Meiling Wang, Jun Li, Satish K. Yanamanamanda, Lakshmi Kalpana Vakati, Kishore Kumar Muchherla. Modeling the Driver Load in the Presence of Process Variations
2275 -- 2282Qingwei Wu, Michael S. Hsiao. State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation
2282 -- 2286Shu Yan, Vivek Sarin, Weiping Shi. Fast 3-D Capacitance Extraction by Inexact Factorization and Reduction
2287 -- 2293Bo Yang, Kaijie Wu, Ramesh Karri. Secure Scan: A Design-for-Test Architecture for Crypto Chips