Journal: IEEE Trans. VLSI Syst.

Volume 21, Issue 7

1181 -- 1188Yalcin Yilmaz, Pinaki Mazumder. Nonvolatile Nanopipelining Logic Using Multiferroic Single-Domain Nanomagnets
1189 -- 1200Jeongha Park, Saeroonter Oh, Soyoung Kim, H.-S. Philip Wong, S. Simon Wong. Impact of III-V and Ge Devices on Circuit Performance
1201 -- 1209Himanshu Thapliyal, Nagarajan Ranganathan, Saurabh Kotiyal. Design of Testable Reversible Sequential Circuits
1210 -- 1219Zijian He, Tao Lv, Huawei Li, Xiaowei Li 0001. Test Path Selection for Capturing Delay Failures Under Statistical Timing Model
1220 -- 1233Ying Zhang, Huawei Li, Xiaowei Li 0001. Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors
1234 -- 1245Minyoung Song, Sunghoon Ahn, Inhwa Jung, Yongtae Kim, Chulwoo Kim. Piecewise Linear Modulation Technique for Spread Spectrum Clock Generation
1246 -- 1259Ting-Chi Tong, Yun-Nan Chang. Efficient Vector Graphics Rasterization Accelerator Using Optimized Scan-Line Buffer
1260 -- 1270Ching-Yi Chen, Sheng-Hung Wang, Cheng-Wen Wu. Write Current Self-Configuration Scheme for MRAM Yield Improvement
1271 -- 1284Wanyong Tian, Yingchao Zhao, Liang Shi, Qing'an Li, Jianhua Li, Chun Jason Xue, Minming Li, Enhong Chen. Task Allocation on Nonvolatile-Memory-Based Hybrid Main Memory
1285 -- 1298Oguzhan Atak, Abdullah Atalar. BilRC: An Execution Triggered Coarse Grained Reconfigurable Architecture
1299 -- 1307Vadim Smolyakov, P. Glenn Gulak, Timothy Gallagher, Curtis Ling. Fault-Tolerant Embedded-Memory Strategy for Baseband Signal Processing Systems
1308 -- 1321Hamid Shojaei, Azadeh Davoodi, Twan Basten. Collaborative Multiobjective Global Routing
1322 -- 1332Jienan Chen, JianHao Hu. Energy-Efficient Digital Signal Processing via Voltage-Overscaling-Based Residue Number System
1333 -- 1337Katherine Shu-Min Li, Yi-Yu Liao. IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test
1337 -- 1341Seong-In Hwang, Hanho Lee. Block-Circulant RS-LDPC Code: Code Construction and Efficient Decoder Design
1342 -- 1345Luke Pierce, Spyros Tragoudas. Enhanced Secure Architecture for Joint Action Test Group Systems
1346 -- 1350Sohan Purohit, Sai Rahul Chalamalasetti, Martin Margala, Wim Vanderbauwhede. Throughput/Resource-Efficient Reconfigurable Processor for Multimedia Applications
1350 -- 1354Yangyang Pan, Guiqiang Dong, Tong Zhang 0002. Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes
1354 -- 1359Irith Pomeranz. Reduced Power Transition Fault Test Sets for Circuits With Independent Scan Chain Modes
1359 -- 1363Irith Pomeranz. Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests
1364 -- 1368Naveed Imran, Jooheung Lee, Ronald F. DeMara. Fault Demotion Using Reconfigurable Slack (FaDReS)
1368 -- 1373Jung-Hyun Park, Dong-Hoon Jung, Kyungho Ryu, Seong-Ook Jung. ADDLL for Clock-Deskew Buffer in High-Performance SoCs