The following publications are possibly variants of this publication:
- Optimized integration of test compression and sharing for SOC testingAnders Larsson, Erik Larsson, Petru Eles, Zebo Peng. date 2007: 207-212 [doi]
- A Unified Approach for SOC Testing Using Test Data Compression and TAM OptimizationVikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty. date 2003: 11188-11190 [doi]
- Core-Level Compression Technique Selection and SOC Test Architecture DesignAnders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty. ats 2008: 277-282 [doi]
- Test-Length Selection and TAM Optimization for Wafer-Level, Reduced Pin-Count Testing of Core-Based Digital SoCsSudarshan Bahukudumbi, Krishnendu Chakrabarty. vlsid 2007: 459-464 [doi]
- The Design and Optimization of SOC Test SolutionsErik Larsson, Zebo Peng, Gunnar Carlsson. iccad 2001: 523-530 [doi]
- Test Resource Partitioning and Optimization for SOC DesignsErik Larsson, Hideo Fujiwara. vts 2003: 319-324 [doi]
- An Integrated Framework for the Design and Optimization of SOC Test SolutionsErik Larsson, Zebo Peng. et, 18(4-5):385-400, 2002. [doi]