Abstract is missing.
- Day 1 keynote: EDA's key to success: Riding waves of innovationGreg Hinckley. [doi]
- Day 1: Invited talk 1: IC qualification, testing & manufacturing using advanced package offerings & adequate process technologiesMohamed Djadoudi. [doi]
- Day 1: Invited talk 2: Dependable mixed-signal integrated systems under agingHans G. Kerkhoff. [doi]
- Day 2 keynote: IoT fosters semiconductor innovationMojy C. Chian. [doi]
- Day 2: Invited talk spintronic microsystems: Integrating analog devices with CMOSPaulo Freitas. [doi]
- Day 2: Mini-tutorial: Challenges to the design and optimization of cyber-physical systemsZebo Peng. [doi]
- RF filter characterization using a chirpPeter Sarson. 1-5 [doi]
- Exploiting satisfiability modulo theories for analog layout automationSherif M. Saif, Mohamed Dessouky, Salwa M. Nassar, Hazem M. Abbas, M. Watheq El-Kharashi, Mohammad Abdulaziz. 1-6 [doi]
- Design for security test on cryptographic ICs for design-time security evaluationCuiping Shao, Huiyun Li, Guoqing Xu, Xiaobo Hu. 1-6 [doi]
- ZnO based gas sensor testingYamna Bakha, Yassine Djeridane, Walid Aouimeur, Lamia Menasri, Abderrazak Smatti, Saad Hamzaoui. 1-3 [doi]
- Scalable high speed serial interface for data converters: Using the JESD204B industry standardHakim Saheb, Syed Haider. 6-11 [doi]
- Failure and root cause analysis for a system-on-chip: An industrial case studySamir Boubezari, Jayant Chhabria. 12 [doi]
- Design, manufacturing & test of integrated circuits in the nanotechnology eraOmar Kebichi. 13-17 [doi]
- iJTAG integration of complex digital embedded instrumentsAhmed Ibrahim, Hans G. Kerkhoff. 18-23 [doi]
- High speed special function unit for graphics processing unitAbd-Elrahman G. Qoutb, Abdullah M. El-Gunidy, Mohammed F. Tolba, Magdy A. El-Moursy. 24-29 [doi]
- High performance MAC designsNikolaos Eftaxiopoulos-Sarris, Georgios Zervakis, Kiamal Z. Pekmestzi, Costas Efstathiou. 30-35 [doi]
- Efficient embedded SoC hardware/software codesign using virtual platformMagdy A. El-Moursy, Ayman Sheirah, Mona Safar, Ashraf Salem. 36-38 [doi]
- An independent dual gate SOI FinFET soft-error resilient memory cellNikolaos Eftaxiopoulos-Sarris, Nicholas Axelos, Georgios Zervakis, Kostas Tsoumanis, Kiamal Z. Pekmestzi. 39-44 [doi]
- Early reliability evaluation of a biomédical systemH. Hakobyan, P. Rech Ufrgs, Matteo Sonza Reorda, Massimo Violante. 45-50 [doi]
- Low-cost EVM built-in test of RF transceiversAyssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir. 51-54 [doi]
- Accurate analog/RF BIST evaluation based on SVM classification of the process parametersAhcène Bounceur, Belkacem Brahmi, Kamel Beznia, Reinhardt Euler. 55-60 [doi]
- Nonvolatile memories: Present and future challengesElena I. Vatajelu, Hassen Aziza, Cristian Zambelli. 61-66 [doi]
- Integration of STT-MRAM model into CACTI simulatorS. Arcaro, Stefano Di Carlo, Marco Indaco, D. Pala, Paolo Prinetto, Elena I. Vatajelu. 67-72 [doi]
- RF and non-linearity characterization of porous silicon layer for RF-ICsYasmina Belaroussi, Abdelhalim Slimane, Mohand-Tahar Belaroussi, Mohamed Trabelsi, Gilles Scheen, Khaled Ben Ali, Jean-Pierre Raskin. 79-82 [doi]
- Multi-device layout templates for nanometer analog designMohannad Elshawy, Mohamed Dessouky, Sherif Saif, Sherif Mansour, Ed Petrus. 83-88 [doi]
- WaferCatalyst - Towards promotion of IC design in the middle east using virtual community approachShahab A. Najmi, Abdulfattah Mohammad Obeid, Mohammed S. BenSaleh. 89-93 [doi]
- A UVM-based smart functional verification platform: Concepts, pros, cons, and opportunitiesKhaled Salah. 94-99 [doi]
- SAT-based speedpath debugging using X tracesMehdi Dehbashi, Görschwin Fey. 100-105 [doi]
- Automated formal verification of X propagation with respect to testability issuesMehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß. 106-111 [doi]
- Impact analysis of resistive bridge within deep submicron Secured CMOS circuitsG. Ait Abdelmalek, R. Ziani. 112-117 [doi]
- Computational complexity in test-generation algorithmsJózsef Sziray. 124-129 [doi]
- Modeling sequential circuits with shared structurally synthesized BDDsRaimund Ubar, Mihhail Marenkov, Dmitri Mironov, Vladimir Viies. 130-135 [doi]
- BDD based synthesis of Boolean functions using memristorsSayak Chakraborti, Paturi Varun Chowdhary, Kamalika Datta, Indranil Sengupta. 136-141 [doi]
- Reliability analysis of CMOS inverter subjected to AC & DC NBTI stressesAmel Chenouf, Boualem Djezzar, Abdelmadjid Benabadelmoumene, Hakim Tahi, Mohamed Goudjil. 142-146 [doi]
- Parallel computing using memristive crossbar networks: Nullifying the processor-memory bottleneckAlvaro Velasquez, Sumit Kumar Jha. 147-152 [doi]
- Translating of MATLAB/SIMULINLK model to synchronous dataflow graph for parallelism analysis and programming embedded multicore systemsKaouther Guesmi, Salem Hasnaoui. 156-161 [doi]
- Rapid prototyping of PVS into FPGA: From model based design to FPGA/ASICs implementationSabrina Titri, Cherif Larbes, Kamal Youcef-Toumi. 162-167 [doi]
- Enhanced bit-width optimization for linear circuits with feedbacksEl-sedik Lamini, Rima Bellal, Samir Tagzout, Hacène Belbachir, Adel Belouchrani. 168-173 [doi]
- A new binary arithmetic for finite-word-length linear controllers: MEMS applicationsAbdelkrim Kamel Oudjida, Ahmed Liacha, Mohamed Lamine Berrandjia, Nicolas Chaillet. 174-179 [doi]
- A new efficient reduction scheme to implement tree multipliers on FPGAsKhaldoon M. Mhaidat, Abdulmughni Y. Hamzah. 180-184 [doi]
- A 0.9 V low power reconfigurable CMOS folded cascode LNA for multi-standard wireless applicationsAbdelkader Taibi, Abdelhalim Slimane, Sid-Ahmed Tedjini-Bailiche, Mohand-Tahar Belaroussi, Djabar Maafri, Mohamed Trabelsi. 185-188 [doi]
- A comparative study of various microstrip bandpass filters topologies for UWB applicationsA. A. Saadi, Mustapha C. E. Yagoub, Rachida Touhami. 189-192 [doi]
- Formal verification of AUTOSAR FlexRay state managerGhada Moussa Bahig, Amr El-Kadi, Ashraf Salem. 193-198 [doi]
- A high radix montgomery multiplier with concurrent error detectionGeorgios Zervakis, Nikolaos Eftaxiopoulos-Sarris, Kostas Tsoumanis, Nicholas Axelos, Kiamal Z. Pekmestzi. 199-204 [doi]
- n+1 addition and multiplication for redundant operandsKostas Tsoumanis, Constantinos Efstathiou, Kiamal Z. Pekmestzi. 205-210 [doi]
- Design and implementation of Wishbone bridge for an iSLIP based NoCNejib Mediouni, Samir Ben Abid, Oussama Kallel, Kaouthar Guesmi, Salem Hasnaoui. 211-214 [doi]
- m) multipliers on FPGAHaichour Amina Selma, Hamadouche M'hamed. 215-218 [doi]
- An improved electronic voting machine using a microcontroller and a smart cardDichou Karima, Tourtchine Victor, Rahmoune Faycal. 219-224 [doi]
- High throughput parallel montgomery modular exponentiation on FPGANadjia Anane, Mohamed Anane. 225-230 [doi]
- +, H and H2 as diffusion speciesMohamed Boubaaya, Hakim Tahi, Boualem Djezzar, Karim Benmassai, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Djamila Doumaz, Abdelhak Feraht Hemida. 231-235 [doi]
- Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extractionHakim Tahi, Boualem Djezzar, Karim Benmassai, Mohamed Boubaaya, Abdelmadjid Benabdelmoumene, Amel Chenouf, Mohamed Goudjil. 236-241 [doi]
- Analytical approach of the impact of through silicon via on the performance of MOS devicesBenkechkache Mohamed El Amine, Latreche Saida, Gian-Franco Dalla Betta. 242-247 [doi]
- Reliability assessment of backward error recovery for SRAM-based FPGAsFouad Sahraoui, Ghaffari Fakhreddine, Mohamed El Amine Benkhelifa, Bertrand Granado. 248-252 [doi]
- TSV-based 3D integration fabrication technologies: An overviewKhaled Salah. 253-256 [doi]
- Modeling of silicon MEMS capacitive pressure sensor for biomédical applicationsLakhdari Abdelghani, MekkakiaMaaza Nasr-Eddine, Maamar Azouza, Bouguenna Abdellah, Kichene Moadh. 263-266 [doi]