Journal: VLSI Design

Volume 5, Issue 3

0 -- 0Rafic Z. Makki. Advancements in Power Supply Current Testing
223 -- 240Mahmoud Al-Qutayri, Peter R. Shepherd. Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits
241 -- 252Eugeni Isern, Joan Figueras. DDQ Detectable Bridges in Combinational CMOS Circuits
253 -- 271Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole. DDQ Testing Experiments for Various CMOS Logic Design Structures
273 -- 284VĂ­ctor H. Champac, Joan Figueras. Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects
285 -- 298Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong. Operational and Test Performance in the Presence of Built-in Current Sensors
299 -- 311Suntae Hwang, Rochit Rajsuman. VLSI Testing for High Reliability: Mixing IDDQ Testing With Logic Testing

Volume 5, Issue 2

0 -- 0Fadi J. Kurdahi. Linking Behavioral, Structural, and Physical Models of Hardware
111 -- 124Massoud Pedram, Narasimha B. Bhat, Ernest S. Kuh. Combining Technology Mapping With Layout
125 -- 140Mandalagiri S. Chandrasekhar, Robert H. McCharles, David E. Wallace. Effective Coupling Between Logic Synthesis and Layout Tools for Synthesis of Area and Speed-Efficient Circuits
141 -- 153Akhilesh Tyagi. Statistical Module Level Area and Delay Estimation
155 -- 165Nikil D. Dutt, Pradip K. Jha. RT Component Sets for High-Level Design Applications
167 -- 182Ian G. Harris, Alex Orailoglu. Module Selection in Microarchitectural Synthesis for Multiple Critical Constraint Satisfaction
183 -- 193Jen-Pin Weng, Alice C. Parker. Taking Thermal Considerations Into Account During High-Level Synthesis
195 -- 209Allen C.-H. Wu. Datapath Optimization Using Layout Information: An Empirical Study
211 -- 221Fur-Shing Tsai, Yu-Chin Hsu. Layout Modeling and Design Space Exploration in Pss1 System

Volume 5, Issue 1

1 -- 10Kuo-En Chang, Sei-Wang Chen. An Efficient and Fast Algorithm for Routing Over the Cells
11 -- 21Dinesh Bhatia, V. Shankar. Greedy Segmented Channel Router
23 -- 36Gudni Gudmundsson, Simeon C. Ntafos. A Greedy Algorithm for Over-The-Cell Channel Routing
37 -- 48Youssef Saab. A Fast Clustering-Based Min-Cut Placement Algorithm With Simulated-Annealing Performance
49 -- 57Bhanu Kapoor, V. S. S. Nair. Improving Path Sensitizability of Combinational Circuits
59 -- 75Jiabi Zhu, Mostafa I. H. Abd-El-Barr, Carl McCrosky. A New Theory for Testability-Preserving Optimization of Combinational Circuits
77 -- 87C. P. Ravikumar, Vikram Saxena. TOGAPS: A Testability Oriented Genetic Algorithm For Pipeline Synthesis
89 -- 100Donald T. Comer. Zener Zap Anti-Fuse Trim in VLSI Circuits
101 -- 110Murray W. Pearson, Paul J. Lyons, Mark D. Apperley. High-Level Graphical Abstraction in Digital Design