IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults - researchr publication related

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Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, Chung-Len Lee, Jwu E. Chen. IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 366-371, IEEE, 2006. [doi]

The following publications are possibly variants of this publication:

IEEE Standard 1500 Compatible Interconnect Diagnosis for Delay and Crosstalk FaultsKatherine Shu-Min Li, Chauchin Su, Yao-Wen Chang, Chung-Len Lee, Jwu E. Chen. tcad, 25(11):2513-2525, 2006. [doi]

IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk DetectionKatherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen. et, 23(4):341-355, 2007. [doi]

IEEE Standard 1500 Compatible Delay Test FrameworkPo-Lin Chen, Jhih-Wei Lin, Tsin-Yuan Chang. tvlsi, 17(8):1152-1156, 2009. [doi]

IEEE 1500 Compatible Interconnect Test with Maximal Test ConcurrencyKatherine Shu-Min Li, Yi-Yu Liao, Yuo-Wen Liu, Jr-Yang Huang. ats 2009: 269-274 [doi]

IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect TestKatherine Shu-Min Li, Yi-Yu Liao. tvlsi, 21(7):1333-1337, 2013. [doi]

Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 StandardLaung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li. itc 2008: 1-9 [doi]

IEEE 1500 Compatible Secure Test Wrapper For Embedded IP CoresGeng-Ming Chiu, James Chien-Mo Li. itc 2008: 1 [doi]

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