The following publications are possibly variants of this publication:
- Vector replacement to improve static-test compaction forsynchronous sequential circuitsIrith Pomeranz, Sudhakar M. Reddy. tcad, 20(2):336-342, 2001. [doi]
- Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector RestorationRuifeng Guo, Irith Pomeranz, Sudhakar M. Reddy. date 1998: 583 [doi]
- Procedures for Static Compaction of Test Sequences for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. TC, 49(6):596-607, 2000. [doi]
- Static test compaction for synchronous sequential circuits based on vector restorationIrith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo. tcad, 18(7):1040-1049, 1999. [doi]
- Vector Restoration Based Static Compaction of Test Sequences for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. iccd 1997: 360-365
- On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential CircuitIrith Pomeranz, Sudhakar M. Reddy. TC, 53(9):1121-1133, 2004. [doi]
- Test sequences to achieve high defect coverage for synchronous sequential circuitsIrith Pomeranz, Sudhakar M. Reddy. tcad, 17(10):1017-1029, 1998. [doi]
- On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential CircuitIrith Pomeranz, Sudhakar M. Reddy. vts 2003: 173-178 [doi]
- TEMPLATES: A Test Generation Procedure for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. ats 1997: 74 [doi]
- On generating compact test sequences for synchronous sequential circuitsIrith Pomeranz, Sudhakar M. Reddy. eurodac 1995: 105-110 [doi]
- On Static Compaction of Test Sequences for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. dac 1996: 215-220 [doi]
- EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverageIrith Pomeranz, Sudhakar M. Reddy. vts 1997: 329-335 [doi]
- Increasing Fault Coverage for Synchronous Sequential Circuits by the Multiple Observation Time Test StrategyIrith Pomeranz, Sudhakar M. Reddy, Lakshmi N. Reddy. iccad 1991: 454-457